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Title: Electro-optic modulation for high-speed characterization of entangled photon pairs

Abstract

In this study, we demonstrate a new biphoton manipulation and characterization technique based on electro-optic intensity modulation and time shifting. By applying fast modulation signals with a sharply peaked cross-correlation to each photon from an entangled pair, it is possible to measure temporal correlations with significantly higher precision than that attainable using standard single-photon detection. Low-duty-cycle pulses and maximal-length sequences are considered as modulation functions, reducing the time spread in our correlation measurement by a factor of five compared to our detector jitter. With state-of-the-art electro-optic components, we expect the potential to surpass the speed of any single-photon detectors currently available.

Authors:
 [1];  [2];  [2];  [2]
+ Show Author Affiliations
  1. Purdue Univ., West Lafayette, IN (United States); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  2. Purdue Univ., West Lafayette, IN (United States)
Publication Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Laboratory Directed Research and Development (LDRD) Program
OSTI Identifier:
1327738
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Accepted Manuscript
Journal Name:
Optics Letters
Additional Journal Information:
Journal Volume: 40; Journal Issue: 22; Journal ID: ISSN 0146-9592
Publisher:
Optical Society of America (OSA)
Country of Publication:
United States
Language:
English
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; photon statistics; electro-optical devices; correlators

Citation Formats

Lukens, Joseph M., Odele, Ogaga D., Leaird, Daniel E., and Weiner, Andrew M. Electro-optic modulation for high-speed characterization of entangled photon pairs. United States: N. p., 2015. Web. doi:10.1364/OL.40.005331.
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Lukens, Joseph M., Odele, Ogaga D., Leaird, Daniel E., & Weiner, Andrew M. Electro-optic modulation for high-speed characterization of entangled photon pairs. United States. https://doi.org/10.1364/OL.40.005331
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Lukens, Joseph M., Odele, Ogaga D., Leaird, Daniel E., and Weiner, Andrew M. Tue . "Electro-optic modulation for high-speed characterization of entangled photon pairs". United States. https://doi.org/10.1364/OL.40.005331. https://www.osti.gov/servlets/purl/1327738.
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@article{osti_1327738,
title = {Electro-optic modulation for high-speed characterization of entangled photon pairs},
author = {Lukens, Joseph M. and Odele, Ogaga D. and Leaird, Daniel E. and Weiner, Andrew M.},
abstractNote = {In this study, we demonstrate a new biphoton manipulation and characterization technique based on electro-optic intensity modulation and time shifting. By applying fast modulation signals with a sharply peaked cross-correlation to each photon from an entangled pair, it is possible to measure temporal correlations with significantly higher precision than that attainable using standard single-photon detection. Low-duty-cycle pulses and maximal-length sequences are considered as modulation functions, reducing the time spread in our correlation measurement by a factor of five compared to our detector jitter. With state-of-the-art electro-optic components, we expect the potential to surpass the speed of any single-photon detectors currently available.},
doi = {10.1364/OL.40.005331},
journal = {Optics Letters},
number = 22,
volume = 40,
place = {United States},
year = {Tue Nov 10 00:00:00 EST 2015},
month = {Tue Nov 10 00:00:00 EST 2015}
}
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https://doi.org/10.1364/OL.40.005331
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    Works referencing / citing this record:

    Bandwidth manipulation of quantum light by an electro-optic time lens
    journal, November 2016

    • Karpiński, Michał; Jachura, Michał; Wright, Laura J.
    • Nature Photonics, Vol. 11, Issue 1
    • DOI: 10.1038/nphoton.2016.228

    Arbitrary shaping of biphoton correlations using near-field frequency-to-time mapping
    journal, January 2018

    • Lu, Hsuan-Hao; Odele, Ogaga D.; Leaird, Daniel E.
    • Optics Letters, Vol. 43, Issue 4
    • DOI: 10.1364/ol.43.000743
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