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Title: The impact of plasma dynamics on the self-magnetic-pinch diode impedance

Abstract

In this study, the self-magnetic-pinch diode is being developed as an intense electron beam source for pulsed-power-driven x-ray radiography. The basic operation of this diode has long been understood in the context of pinched diodes, including the dynamic effect that the diode impedance decreases during the pulse due to electrode plasma formation and expansion. Experiments being conducted at Sandia National Laboratories' RITS-6 accelerator are helping to characterize these plasmas using time-resolved and time-integrated camera systems in the x-ray and visible. These diagnostics are analyzed in conjunction with particle-in-cell simulations of anode plasma formation and evolution. The results confirm the long-standing theory of critical-current operation with the addition of a time-dependent anode-cathode gap length. Finally, the results may suggest that anomalous impedance collapse is driven by increased plasma radial drift, leading to larger-than-average ion vr × Bθ acceleration into the gap.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [2];  [3];  [3];  [3];  [3];  [3];  [3];  [3];  [3];  [3];  [3]
+ Show Author Affiliations
  1. National Security Technologies, LLC, Las Vegas, NV (United States)
  2. Voss Scientific, LLC, Albuquerque, NM (United States)
  3. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); National Security Technologies, LLC. (NSTec), Las Vegas, NV (United States); Sandia National Lab. (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1235342
Alternate Identifier(s):
OSTI ID: 1228566; OSTI ID: 1242535
Report Number(s):
SAND-2015-0768J; DOE/NV/25946-2277
Journal ID: ISSN 1070-664X; PHPAEN; 562632
Grant/Contract Number:  
AC04-94AL85000; AC52-06NA25946
Resource Type:
Accepted Manuscript
Journal Name:
Physics of Plasmas
Additional Journal Information:
Journal Volume: 22; Journal Issue: 3; Journal ID: ISSN 1070-664X
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY; anodes; cathodes; plasma diagnostics; contaminants; plasma expansion

Citation Formats

Bennett, Nichelle, Crain, M. Dale, Droemer, Darryl W., Gignac, Raymond E., Molina, Isidro, Obregon, Robert, Smith, Chase C., Wilkins, Frank L., Welch, Dale Robert, Cordova, Steve, Johnston, Mark D., Kiefer, Mark L., Leckbee, Joshua J., Mazarakis, Michael G., Nielsen, Dan S., Romero, Tobias, Simpson, Sean, Webb, Timothy Jay, and Ziska, Derek. The impact of plasma dynamics on the self-magnetic-pinch diode impedance. United States: N. p., 2015. Web. doi:10.1063/1.4916062.
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Bennett, Nichelle, Crain, M. Dale, Droemer, Darryl W., Gignac, Raymond E., Molina, Isidro, Obregon, Robert, Smith, Chase C., Wilkins, Frank L., Welch, Dale Robert, Cordova, Steve, Johnston, Mark D., Kiefer, Mark L., Leckbee, Joshua J., Mazarakis, Michael G., Nielsen, Dan S., Romero, Tobias, Simpson, Sean, Webb, Timothy Jay, & Ziska, Derek. The impact of plasma dynamics on the self-magnetic-pinch diode impedance. United States. https://doi.org/10.1063/1.4916062
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Bennett, Nichelle, Crain, M. Dale, Droemer, Darryl W., Gignac, Raymond E., Molina, Isidro, Obregon, Robert, Smith, Chase C., Wilkins, Frank L., Welch, Dale Robert, Cordova, Steve, Johnston, Mark D., Kiefer, Mark L., Leckbee, Joshua J., Mazarakis, Michael G., Nielsen, Dan S., Romero, Tobias, Simpson, Sean, Webb, Timothy Jay, and Ziska, Derek. Fri . "The impact of plasma dynamics on the self-magnetic-pinch diode impedance". United States. https://doi.org/10.1063/1.4916062. https://www.osti.gov/servlets/purl/1235342.
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@article{osti_1235342,
title = {The impact of plasma dynamics on the self-magnetic-pinch diode impedance},
author = {Bennett, Nichelle and Crain, M. Dale and Droemer, Darryl W. and Gignac, Raymond E. and Molina, Isidro and Obregon, Robert and Smith, Chase C. and Wilkins, Frank L. and Welch, Dale Robert and Cordova, Steve and Johnston, Mark D. and Kiefer, Mark L. and Leckbee, Joshua J. and Mazarakis, Michael G. and Nielsen, Dan S. and Romero, Tobias and Simpson, Sean and Webb, Timothy Jay and Ziska, Derek},
abstractNote = {In this study, the self-magnetic-pinch diode is being developed as an intense electron beam source for pulsed-power-driven x-ray radiography. The basic operation of this diode has long been understood in the context of pinched diodes, including the dynamic effect that the diode impedance decreases during the pulse due to electrode plasma formation and expansion. Experiments being conducted at Sandia National Laboratories' RITS-6 accelerator are helping to characterize these plasmas using time-resolved and time-integrated camera systems in the x-ray and visible. These diagnostics are analyzed in conjunction with particle-in-cell simulations of anode plasma formation and evolution. The results confirm the long-standing theory of critical-current operation with the addition of a time-dependent anode-cathode gap length. Finally, the results may suggest that anomalous impedance collapse is driven by increased plasma radial drift, leading to larger-than-average ion vr × Bθ acceleration into the gap.},
doi = {10.1063/1.4916062},
journal = {Physics of Plasmas},
number = 3,
volume = 22,
place = {United States},
year = {Fri Mar 20 00:00:00 EDT 2015},
month = {Fri Mar 20 00:00:00 EDT 2015}
}
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https://doi.org/10.1063/1.4916062
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    Works referencing / citing this record:

    Contribution of the backstreaming ions to the self-magnetic pinch (SMP) diode current
    journal, April 2018

    • Mazarakis, Michael G.; Bennett, Nichelle; Cuneo, Michael E.
    • Physics of Plasmas, Vol. 25, Issue 4
    • DOI: 10.1063/1.5009014

    Zeeman spectroscopy as a method for determining the magnetic field distribution in self-magnetic-pinch diodes (invited)
    journal, October 2018

    • Patel, S. G.; Johnston, M. D.; Webb, T. J.
    • Review of Scientific Instruments, Vol. 89, Issue 10
    • DOI: 10.1063/1.5039386
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