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Title: X-ray power and yield measurements at the refurbished Z machine

Abstract

Advancements have been made in the diagnostic techniques to measure accurately the total radiated x-ray yield and power from z-pinch loads at the Z Machine with high accuracy. The Z-accelerator is capable of outputting 2MJ and 330 TW of x-ray yield and power, and accurately measuring these quantities is imperative. We will describe work over the past several years which include the development of new diagnostics, improvements to existing diagnostics, and implementation of automated data analysis routines. A set of experiments were conducted on the Z machine where the load and machine configuration were held constant. During this shot series, it was observed that total z-pinch x-ray emission power determined from the two common techniques for inferring the x-ray power, Kimfol filtered x-ray diode diagnostic and the Total Power and Energy diagnostic gave 450 TW and 327 TW respectively. Our analysis shows the latter to be the more accurate interpretation. More broadly, the comparison demonstrates the necessity to consider spectral response and field of view when inferring xray powers from z-pinch sources.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]
+ Show Author Affiliations
  1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1145734
Report Number(s):
SAND2014-4261J
Journal ID: ISSN 0034-6748; RSINAK; 518375
Grant/Contract Number:  
AC04-94AL85000
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 85; Journal Issue: 8; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS

Citation Formats

Jones, M. C., Ampleford, D. J., Cuneo, M. E., Hohlfelder, R., Jennings, C. A., Johnson, D. W., Jones, B., Lopez, M. R., MacArthur, J., Mills, J. A., Preston, T., Rochau, G. A., Savage, M., Spencer, D., Sinars, D. B., and Porter, J. L. X-ray power and yield measurements at the refurbished Z machine. United States: N. p., 2014. Web. doi:10.1063/1.4891316.
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Jones, M. C., Ampleford, D. J., Cuneo, M. E., Hohlfelder, R., Jennings, C. A., Johnson, D. W., Jones, B., Lopez, M. R., MacArthur, J., Mills, J. A., Preston, T., Rochau, G. A., Savage, M., Spencer, D., Sinars, D. B., & Porter, J. L. X-ray power and yield measurements at the refurbished Z machine. United States. https://doi.org/10.1063/1.4891316
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Jones, M. C., Ampleford, D. J., Cuneo, M. E., Hohlfelder, R., Jennings, C. A., Johnson, D. W., Jones, B., Lopez, M. R., MacArthur, J., Mills, J. A., Preston, T., Rochau, G. A., Savage, M., Spencer, D., Sinars, D. B., and Porter, J. L. Mon . "X-ray power and yield measurements at the refurbished Z machine". United States. https://doi.org/10.1063/1.4891316. https://www.osti.gov/servlets/purl/1145734.
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@article{osti_1145734,
title = {X-ray power and yield measurements at the refurbished Z machine},
author = {Jones, M. C. and Ampleford, D. J. and Cuneo, M. E. and Hohlfelder, R. and Jennings, C. A. and Johnson, D. W. and Jones, B. and Lopez, M. R. and MacArthur, J. and Mills, J. A. and Preston, T. and Rochau, G. A. and Savage, M. and Spencer, D. and Sinars, D. B. and Porter, J. L.},
abstractNote = {Advancements have been made in the diagnostic techniques to measure accurately the total radiated x-ray yield and power from z-pinch loads at the Z Machine with high accuracy. The Z-accelerator is capable of outputting 2MJ and 330 TW of x-ray yield and power, and accurately measuring these quantities is imperative. We will describe work over the past several years which include the development of new diagnostics, improvements to existing diagnostics, and implementation of automated data analysis routines. A set of experiments were conducted on the Z machine where the load and machine configuration were held constant. During this shot series, it was observed that total z-pinch x-ray emission power determined from the two common techniques for inferring the x-ray power, Kimfol filtered x-ray diode diagnostic and the Total Power and Energy diagnostic gave 450 TW and 327 TW respectively. Our analysis shows the latter to be the more accurate interpretation. More broadly, the comparison demonstrates the necessity to consider spectral response and field of view when inferring xray powers from z-pinch sources.},
doi = {10.1063/1.4891316},
journal = {Review of Scientific Instruments},
number = 8,
volume = 85,
place = {United States},
year = {Mon Aug 04 00:00:00 EDT 2014},
month = {Mon Aug 04 00:00:00 EDT 2014}
}
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https://doi.org/10.1063/1.4891316
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    Works referencing / citing this record:

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