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Title: Variable magnification with Kirkpatrick-Baez optics for synchrotron X-ray microscopy

In this study, we describe the distinction between the operation of a short focal length x-ray microscope forming a real image with a laboratory source (convergent illumination) and with a highly collimated intense beam from a synchrotron light source (Kohler illumination).
Authors:
 [1] ;  [2] ;  [2] ;  [3] ;  [4]
  1. National Institute of Standards and Technology, Gaithersburg, MD (United States)
  2. Purdue Univ., West Lafayette, IN (United States)
  3. J. Pedulla Associates, Silver Springs, MD (United States)
  4. Argonne National Lab. (ANL), Argonne, IL (United States)
Publication Date:
OSTI Identifier:
898720
Grant/Contract Number:
AC02-06CH11357
Type:
Accepted Manuscript
Journal Name:
Journal of Research of the National Institute of Standards and Technology
Additional Journal Information:
Journal Volume: 111; Journal Issue: 3; Journal ID: ISSN 1044-677X
Publisher:
National Institute of Standards (NIST)
Research Org:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; MICROSCOPY; OPTICS; SYNCHROTRONS advanced photon source