Selective Nanoscale Mass Transport across Atomically Thin Single Crystalline Graphene Membranes
Abstract
Atomically thin single crystals, without grain boundaries and associated defect clusters, represent ideal systems to study and understand intrinsic defects in materials, but probing them collectively over large area remains nontrivial. In this study, the authors probe nanoscale mass transport across large‐area (≈0.2 cm 2 ) single‐crystalline graphene membranes. A novel, polymer‐free picture frame assisted technique, coupled with a stress‐inducing nickel layer is used to transfer single crystalline graphene grown on silicon carbide substrates to flexible polycarbonate track etched supports with well‐defined cylindrical ≈200 nm pores. Diffusion‐driven flow shows selective transport of ≈0.66 nm hydrated K + and Cl − ions over ≈1 nm sized small molecules, indicating the presence of selective sub‐nanometer to nanometer sized defects. This work presents a framework to test the barrier properties and intrinsic quality of atomically thin materials at the sub‐nanometer to nanometer scale over technologically relevant large areas, and suggests the potential use of intrinsic defects in atomically thin materials for molecular separations or desalting.
- Authors:
-
- Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States). Dept. of Mechanical Engineering
- Publication Date:
- Research Org.:
- Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); National Science Foundation (NSF)
- OSTI Identifier:
- 1533035
- Alternate Identifier(s):
- OSTI ID: 1400472
- Grant/Contract Number:
- SC0008059; ECS-0335765; DMR-1419807; DE‐SC0008059
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Advanced Materials
- Additional Journal Information:
- Journal Volume: 29; Journal Issue: 19; Journal ID: ISSN 0935-9648
- Publisher:
- Wiley
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; atomically thin membranes; selective transport; single crystalline graphene; sub-nanometer pores
Citation Formats
Kidambi, Piran R., Boutilier, Michael S. H., Wang, Luda, Jang, Doojoon, Kim, Jeehwan, and Karnik, Rohit. Selective Nanoscale Mass Transport across Atomically Thin Single Crystalline Graphene Membranes. United States: N. p., 2017.
Web. doi:10.1002/adma.201605896.
Kidambi, Piran R., Boutilier, Michael S. H., Wang, Luda, Jang, Doojoon, Kim, Jeehwan, & Karnik, Rohit. Selective Nanoscale Mass Transport across Atomically Thin Single Crystalline Graphene Membranes. United States. https://doi.org/10.1002/adma.201605896
Kidambi, Piran R., Boutilier, Michael S. H., Wang, Luda, Jang, Doojoon, Kim, Jeehwan, and Karnik, Rohit. Fri .
"Selective Nanoscale Mass Transport across Atomically Thin Single Crystalline Graphene Membranes". United States. https://doi.org/10.1002/adma.201605896. https://www.osti.gov/servlets/purl/1533035.
@article{osti_1533035,
title = {Selective Nanoscale Mass Transport across Atomically Thin Single Crystalline Graphene Membranes},
author = {Kidambi, Piran R. and Boutilier, Michael S. H. and Wang, Luda and Jang, Doojoon and Kim, Jeehwan and Karnik, Rohit},
abstractNote = {Atomically thin single crystals, without grain boundaries and associated defect clusters, represent ideal systems to study and understand intrinsic defects in materials, but probing them collectively over large area remains nontrivial. In this study, the authors probe nanoscale mass transport across large‐area (≈0.2 cm 2 ) single‐crystalline graphene membranes. A novel, polymer‐free picture frame assisted technique, coupled with a stress‐inducing nickel layer is used to transfer single crystalline graphene grown on silicon carbide substrates to flexible polycarbonate track etched supports with well‐defined cylindrical ≈200 nm pores. Diffusion‐driven flow shows selective transport of ≈0.66 nm hydrated K + and Cl − ions over ≈1 nm sized small molecules, indicating the presence of selective sub‐nanometer to nanometer sized defects. This work presents a framework to test the barrier properties and intrinsic quality of atomically thin materials at the sub‐nanometer to nanometer scale over technologically relevant large areas, and suggests the potential use of intrinsic defects in atomically thin materials for molecular separations or desalting.},
doi = {10.1002/adma.201605896},
journal = {Advanced Materials},
number = 19,
volume = 29,
place = {United States},
year = {Fri Mar 17 00:00:00 EDT 2017},
month = {Fri Mar 17 00:00:00 EDT 2017}
}
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