Controllable piezoelectricity of Pb(Zr0.2Ti0.8)O3 film via in situ misfit strain
Abstract
In this paper, the tetragonality (c/a) of a PbZr0.2Ti0.8O3 (PZT) thin film on La0.7Sr0.3MnO3/0.72Pb(Mg1/3Nb2/3)O3-0.28PbTiO3 (PMN-PT) substrates was controlled by applying an electric field on the PMN-PT substrate. The piezoelectric response of the PZT thin film under various biaxial strains was observed using time-resolved micro X-ray diffraction. The longitudinal piezoelectric coefficient (d33) was reduced from 29.5 to 14.9 pm/V when the c/a ratio of the PZT film slightly changed from 1.051 to 1.056. Finally, our results demonstrate that the tetragonality of the PZT thin film plays a critical role in determining d33, and in situ strain engineering using electromechanical substrate is useful in excluding the extrinsic effect resulting from the variation in the film thickness or the interface between substrate.
- Authors:
-
- Gwangju Inst. of Science and Technology (Korea, Republic of). School of Materials Science and Engineering
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Quantum Condensed Matter Division
- (Germany). Inst. for Physics
- Martin Luther Univ. of Halle-Wittenberg, Halle (Germany). Inst. for Physics
- Ulsan Inst. of Science and Technology (Korea, Republic of). School of Energy and Chemical Engineering
- Publication Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States); Gwangju Inst. of Science and Technology (Korea, Republic of); Martin Luther Univ. of Halle-Wittenberg, Halle (Germany)
- Sponsoring Org.:
- USDOE Laboratory Directed Research and Development (LDRD) Program; National Research Foundation of Korea (NRF); Gwangju Inst. of Science and Technology (Korea, Republic of); POSCO TJ Park Foundation (Korea, Republic of); German Research Foundation (DFG)
- Contributing Org.:
- Ulsan Inst. of Science and Technology (Korea, Republic of)
- OSTI Identifier:
- 1340448
- Alternate Identifier(s):
- OSTI ID: 1985556
- Grant/Contract Number:
- AC05-00OR22725; NRF-2014R1A1A3053111; SFB 762
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Applied Physics Letters
- Additional Journal Information:
- Journal Volume: 110; Journal Issue: 3; Journal ID: ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; PZT films; piezoelectric fields; piezoelectric transducers; ferroelectric thin films; thin film structure
Citation Formats
Lee, Hyeon Jun, Guo, Er-Jia, Martin Luther Univ. of Halle-Wittenberg, Halle, Kwak, Jeong Hun, Hwang, Seung Hyun, Dörr, Kathrin, Lee, Jun Hee, and Young Jo, Ji. Controllable piezoelectricity of Pb(Zr0.2Ti0.8)O3 film via in situ misfit strain. United States: N. p., 2017.
Web. doi:10.1063/1.4974450.
Lee, Hyeon Jun, Guo, Er-Jia, Martin Luther Univ. of Halle-Wittenberg, Halle, Kwak, Jeong Hun, Hwang, Seung Hyun, Dörr, Kathrin, Lee, Jun Hee, & Young Jo, Ji. Controllable piezoelectricity of Pb(Zr0.2Ti0.8)O3 film via in situ misfit strain. United States. https://doi.org/10.1063/1.4974450
Lee, Hyeon Jun, Guo, Er-Jia, Martin Luther Univ. of Halle-Wittenberg, Halle, Kwak, Jeong Hun, Hwang, Seung Hyun, Dörr, Kathrin, Lee, Jun Hee, and Young Jo, Ji. Wed .
"Controllable piezoelectricity of Pb(Zr0.2Ti0.8)O3 film via in situ misfit strain". United States. https://doi.org/10.1063/1.4974450. https://www.osti.gov/servlets/purl/1340448.
@article{osti_1340448,
title = {Controllable piezoelectricity of Pb(Zr0.2Ti0.8)O3 film via in situ misfit strain},
author = {Lee, Hyeon Jun and Guo, Er-Jia and Martin Luther Univ. of Halle-Wittenberg, Halle and Kwak, Jeong Hun and Hwang, Seung Hyun and Dörr, Kathrin and Lee, Jun Hee and Young Jo, Ji},
abstractNote = {In this paper, the tetragonality (c/a) of a PbZr0.2Ti0.8O3 (PZT) thin film on La0.7Sr0.3MnO3/0.72Pb(Mg1/3Nb2/3)O3-0.28PbTiO3 (PMN-PT) substrates was controlled by applying an electric field on the PMN-PT substrate. The piezoelectric response of the PZT thin film under various biaxial strains was observed using time-resolved micro X-ray diffraction. The longitudinal piezoelectric coefficient (d33) was reduced from 29.5 to 14.9 pm/V when the c/a ratio of the PZT film slightly changed from 1.051 to 1.056. Finally, our results demonstrate that the tetragonality of the PZT thin film plays a critical role in determining d33, and in situ strain engineering using electromechanical substrate is useful in excluding the extrinsic effect resulting from the variation in the film thickness or the interface between substrate.},
doi = {10.1063/1.4974450},
journal = {Applied Physics Letters},
number = 3,
volume = 110,
place = {United States},
year = {Wed Jan 18 00:00:00 EST 2017},
month = {Wed Jan 18 00:00:00 EST 2017}
}
Web of Science
Works referenced in this record:
Strain-controlled switching kinetics of epitaxial PbZr 0.52 Ti 0.48 O 3 films
journal, July 2013
- Herklotz, A.; Guo, E-J; Biegalski, M. D.
- New Journal of Physics, Vol. 15, Issue 7
Modulation of metal-insulator transitions by field-controlled strain in NdNiO3/SrTiO3/PMN-PT (001) heterostructures
journal, February 2016
- Heo, Seungyang; Oh, Chadol; Eom, Man Jin
- Scientific Reports, Vol. 6, Issue 1
Quantification of strain and charge co-mediated magnetoelectric coupling on ultra-thin Permalloy/PMN-PT interface
journal, January 2014
- Nan, Tianxiang; Zhou, Ziyao; Liu, Ming
- Scientific Reports, Vol. 4, Issue 1
Effect of Mechanical Boundary Conditions on Phase Diagrams of Epitaxial Ferroelectric Thin Films
journal, March 1998
- Pertsev, N. A.; Zembilgotov, A. G.; Tagantsev, A. K.
- Physical Review Letters, Vol. 80, Issue 9
Neutron Diffraction Studies of Pb(Zr x Ti 1- x )O 3 Ceramics
journal, September 2000
- Frantti, Johannes; Lappalainen, Jyrki; Eriksson, Sten
- Japanese Journal of Applied Physics, Vol. 39, Issue Part 1, No. 9B
Strain gradients in epitaxial ferroelectrics
journal, July 2005
- Catalan, G.; Noheda, B.; McAneney, J.
- Physical Review B, Vol. 72, Issue 2
Experimental investigation into the effect of substrate clamping on the piezoelectric behaviour of thick-film PZT elements
journal, March 2004
- Torah, R. N.; Beeby, S. P.; White, N. M.
- Journal of Physics D: Applied Physics, Vol. 37, Issue 7
Scaling of structure and electrical properties in ultrathin epitaxial ferroelectric heterostructures
journal, September 2006
- Nagarajan, V.; Junquera, J.; He, J. Q.
- Journal of Applied Physics, Vol. 100, Issue 5
Effect of Epitaxial Strain on the Spontaneous Polarization of Thin Film Ferroelectrics
journal, December 2005
- Ederer, Claude; Spaldin, Nicola A.
- Physical Review Letters, Vol. 95, Issue 25
Intrinsic Nonstoichiometry in Single-Phase Pb(Zr0.5Ti0.5)O3
journal, April 1972
- Holman, R. L.; Fulrath, R. M.
- Journal of the American Ceramic Society, Vol. 55, Issue 4
Intrinsic Ferroelectric Properties of Strained Tetragonal PbZr0.2Ti0.8O3 Obtained on Layer–by–Layer Grown, Defect–Free Single–Crystalline Films
journal, July 2006
- Vrejoiu, I.; Le Rhun, G.; Pintilie, L.
- Advanced Materials, Vol. 18, Issue 13
Structural visualization of polarization fatigue in epitaxial ferroelectric oxide devices
journal, May 2004
- Do, Dal-Hyun; Evans, Paul G.; Isaacs, Eric D.
- Nature Materials, Vol. 3, Issue 6
Nonlinear Piezoelectricity in Epitaxial Ferroelectrics at High Electric Fields
journal, January 2008
- Grigoriev, Alexei; Sichel, Rebecca; Lee, Ho Nyung
- Physical Review Letters, Vol. 100, Issue 2
Lead-free piezoceramics with giant strain in the system Bi0.5Na0.5TiO3–BaTiO3–K0.5Na0.5NbO3. I. Structure and room temperature properties
journal, February 2008
- Zhang, Shan-Tao; Kounga, Alain Brice; Aulbach, Emil
- Journal of Applied Physics, Vol. 103, Issue 3
Effect of annealing atmosphere on domain structures and electromechanical properties of Pb(Zn1/3Nb2/3)O3-based ceramics
journal, September 2001
- Fan, Huiqing; Park, Gun-Tae; Choi, Jong-Jin
- Applied Physics Letters, Vol. 79, Issue 11
Ferroelectric 180° Domain Wall Motion Controlled by Biaxial Strain
journal, January 2015
- Guo, Er-Jia; Roth, Robert; Herklotz, Andreas
- Advanced Materials, Vol. 27, Issue 9
Strain-mediated electric-field control of exchange bias in a Co90Fe10/BiFeO3/SrRuO3/PMN-PT heterostructure
journal, March 2015
- Wu, S. Z.; Miao, J.; Xu, X. G.
- Scientific Reports, Vol. 5, Issue 1
Thickness dependence of structural and piezoelectric properties of epitaxial Pb(Zr0.52Ti0.48)O3 films on Si and SrTiO3 substrates
journal, April 2006
- Kim, D. M.; Eom, C. B.; Nagarajan, V.
- Applied Physics Letters, Vol. 88, Issue 14
Thickness effect on the dielectric, ferroelectric, and piezoelectric properties of ferroelectric lead zirconate titanate thin films
journal, December 2010
- Pérez de la Cruz, J.; Joanni, E.; Vilarinho, P. M.
- Journal of Applied Physics, Vol. 108, Issue 11
Ferroelectricity and Tetragonality in Ultrathin Films
journal, February 2005
- Lichtensteiger, Céline; Triscone, Jean-Marc; Junquera, Javier
- Physical Review Letters, Vol. 94, Issue 4
Misfit strain dependence of ferroelectric and piezoelectric properties of clamped (001) epitaxial Pb(Zr 0.52 ,Ti 0.48 )O 3 thin films
journal, December 2011
- Nguyen, Minh D.; Dekkers, Matthijn; Houwman, Evert
- Applied Physics Letters, Vol. 99, Issue 25
Unit-cell scale mapping of ferroelectricity and tetragonality in epitaxial ultrathin ferroelectric films
journal, December 2006
- Jia, Chun-Lin; Nagarajan, Valanoor; He, Jia-Qing
- Nature Materials, Vol. 6, Issue 1
Critical thickness for extrinsic contributions to the dielectric and piezoelectric response in lead zirconate titanate ultrathin films
journal, January 2011
- Bastani, Yaser; Schmitz-Kempen, Thorsten; Roelofs, Andreas
- Journal of Applied Physics, Vol. 109, Issue 1
Critical thickness for ferroelectricity in perovskite ultrathin films
journal, April 2003
- Junquera, Javier; Ghosez, Philippe
- Nature, Vol. 422, Issue 6931, p. 506-509
Epitaxial BiFeO3 Multiferroic Thin Film Heterostructures
journal, March 2003
- Wang, J.; Neaton, J. B.; Zheng, H.
- Science, Vol. 299, Issue 5613, p. 1719-1722
Phase diagrams and physical properties of single-domain epitaxial thin films
journal, February 2003
- Pertsev, N. A.; Kukhar, V. G.; Kohlstedt, H.
- Physical Review B, Vol. 67, Issue 5
Influence of piezoelectric strain on the Raman spectra of BiFeO 3 films deposited on PMN-PT substrates
journal, January 2016
- Himcinschi, Cameliu; Guo, Er-Jia; Talkenberger, Andreas
- Applied Physics Letters, Vol. 108, Issue 4
Works referencing / citing this record:
Time-resolved X-ray diffraction system for study of Pb(Zr, Ti)O 3 films under a temporal electric field at BL15XU, SPring-8
journal, September 2019
- Seo, Okkyun; Kim, Jaemyung; Song, Chulho
- Review of Scientific Instruments, Vol. 90, Issue 9