Morphology-defined interaction of copper phthalocyanine with O2/H2O
Abstract
Copper phthalocyanine (CuPc) is an important hole transport layer for organic photovoltaics (OPVs), but its interaction with ambient gas/vapor may lead to changes in electronic properties of the material which subsequently limits the lifetime of OPV devices. CuPc films of thickness 25 nm and 100 nm were grown by thermal sublimation at 25°C, 150°C, and 250°C in order to vary morphology. Using a source-measure unit and a quartz crystal microbalance (QCM), we measured changes in electrical resistance and film mass in situ during exposure to controlled pulses of O2 and H2O vapor. Mass loading by O2 was enhanced by a factor of 5 in films deposited at 250 C, possibly due to the ~200° C CuPc -> transition which allows higher O2 mobility between stacked molecules. While gas/vapor sorption occurred over timescales of < 10 minutes, resistance change occurred over timescales > 1 hour, suggesting that mass change occurs by rapid adsorption at active surface sites, whereas resistive response is dominated by slow diffusion of adsorbates into the film bulk. Resistive response generally increases with film deposition temperature due to increased porosity associated with larger crystalline domains. The 25 nm thick films exhibit higher resistive response than 100 nm thickmore »
- Authors:
-
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- California State Univ. Long Beach, Long Beach, CA (United States)
- Publication Date:
- Research Org.:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
- Sponsoring Org.:
- USDOE Office of Science (SC)
- OSTI Identifier:
- 1331093
- Grant/Contract Number:
- AC05-00OR22725
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Journal of Photonics for Energy
- Additional Journal Information:
- Journal Volume: 6; Journal Issue: 4; Journal ID: ISSN 1947-7988
- Publisher:
- SPIE
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 36 MATERIALS SCIENCE; copper; oxygen; adsorption; resistance; diffusion; molecules; crystals; interfaces
Citation Formats
Muckley, Eric S., Miller, Nicholas, Jacobs, Christopher B., Gredig, Thomas, and Ivanov, Ilia N. Morphology-defined interaction of copper phthalocyanine with O2/H2O. United States: N. p., 2016.
Web. doi:10.1117/1.JPE.6.045501.
Muckley, Eric S., Miller, Nicholas, Jacobs, Christopher B., Gredig, Thomas, & Ivanov, Ilia N. Morphology-defined interaction of copper phthalocyanine with O2/H2O. United States. https://doi.org/10.1117/1.JPE.6.045501
Muckley, Eric S., Miller, Nicholas, Jacobs, Christopher B., Gredig, Thomas, and Ivanov, Ilia N. Tue .
"Morphology-defined interaction of copper phthalocyanine with O2/H2O". United States. https://doi.org/10.1117/1.JPE.6.045501. https://www.osti.gov/servlets/purl/1331093.
@article{osti_1331093,
title = {Morphology-defined interaction of copper phthalocyanine with O2/H2O},
author = {Muckley, Eric S. and Miller, Nicholas and Jacobs, Christopher B. and Gredig, Thomas and Ivanov, Ilia N.},
abstractNote = {Copper phthalocyanine (CuPc) is an important hole transport layer for organic photovoltaics (OPVs), but its interaction with ambient gas/vapor may lead to changes in electronic properties of the material which subsequently limits the lifetime of OPV devices. CuPc films of thickness 25 nm and 100 nm were grown by thermal sublimation at 25°C, 150°C, and 250°C in order to vary morphology. Using a source-measure unit and a quartz crystal microbalance (QCM), we measured changes in electrical resistance and film mass in situ during exposure to controlled pulses of O2 and H2O vapor. Mass loading by O2 was enhanced by a factor of 5 in films deposited at 250 C, possibly due to the ~200° C CuPc -> transition which allows higher O2 mobility between stacked molecules. While gas/vapor sorption occurred over timescales of < 10 minutes, resistance change occurred over timescales > 1 hour, suggesting that mass change occurs by rapid adsorption at active surface sites, whereas resistive response is dominated by slow diffusion of adsorbates into the film bulk. Resistive response generally increases with film deposition temperature due to increased porosity associated with larger crystalline domains. The 25 nm thick films exhibit higher resistive response than 100 nm thick films after an hour of O2/H2O exposure due to the smaller analyte diffusion length required for reaching the film/electrode interface. We found evidence of decoupling of CuPc from the gold-coated QCM crystal due to preferential adsorption of O2/H2O molecules on gold, which is consistent with findings of other studies.},
doi = {10.1117/1.JPE.6.045501},
journal = {Journal of Photonics for Energy},
number = 4,
volume = 6,
place = {United States},
year = {Tue Nov 01 00:00:00 EDT 2016},
month = {Tue Nov 01 00:00:00 EDT 2016}
}
Web of Science
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Works referencing / citing this record:
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