Improving the radiation hardness of graphene field effect transistors
Abstract
Ionizing radiation poses a significant challenge to the operation and reliability of conventional silicon-based devices. In this paper, we report the effects of gamma radiation on graphene field-effect transistors (GFETs), along with a method to mitigate those effects by developing a radiation-hardened version of our back-gated GFETs. We demonstrate that activated atmospheric oxygen from the gamma ray interaction with air damages the semiconductor device, and damage to the substrate contributes additional threshold voltage instability. Our radiation-hardened devices, which have protection against these two effects, exhibit minimal performance degradation, improved stability, and significantly reduced hysteresis after prolonged gamma radiation exposure. Finally, we believe this work provides an insight into graphene's interactions with ionizing radiation that could enable future graphene-based electronic devices to be used for space, military, and other radiation-sensitive applications.
- Authors:
-
- Columbia Univ., New York, NY (United States). Dept. of Electrical Engineering
- Brookhaven National Lab. (BNL), Upton, NY (United States). Chemistry Division
- Columbia Univ., New York, NY (United States). Dept. of Mechanical Engineering
- Publication Date:
- Research Org.:
- Brookhaven National Laboratory (BNL), Upton, NY (United States); Columbia Univ., New York, NY (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); National Science Foundation (NSF); Defense Threat Reduction Agency (DTRA) (United States)
- OSTI Identifier:
- 1341676
- Alternate Identifier(s):
- OSTI ID: 1328601
- Report Number(s):
- BNL-113404-2017-JA
Journal ID: ISSN 0003-6951; R&D Project: CO031; KC0304030; TRN: US1701532
- Grant/Contract Number:
- SC0012704; AC02-98CH10886; DMR-1420634; HDTRA1-11-0022
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Applied Physics Letters
- Additional Journal Information:
- Journal Volume: 109; Journal Issue: 15; Journal ID: ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; graphene; gamma rays; Dirac equation; gamma ray effects; x-ray photoelectron spectroscopy
Citation Formats
Alexandrou, Konstantinos, Masurkar, Amrita, Edrees, Hassan, Wishart, James F., Hao, Yufeng, Petrone, Nicholas, Hone, James, and Kymissis, Ioannis. Improving the radiation hardness of graphene field effect transistors. United States: N. p., 2016.
Web. doi:10.1063/1.4963782.
Alexandrou, Konstantinos, Masurkar, Amrita, Edrees, Hassan, Wishart, James F., Hao, Yufeng, Petrone, Nicholas, Hone, James, & Kymissis, Ioannis. Improving the radiation hardness of graphene field effect transistors. United States. https://doi.org/10.1063/1.4963782
Alexandrou, Konstantinos, Masurkar, Amrita, Edrees, Hassan, Wishart, James F., Hao, Yufeng, Petrone, Nicholas, Hone, James, and Kymissis, Ioannis. Tue .
"Improving the radiation hardness of graphene field effect transistors". United States. https://doi.org/10.1063/1.4963782. https://www.osti.gov/servlets/purl/1341676.
@article{osti_1341676,
title = {Improving the radiation hardness of graphene field effect transistors},
author = {Alexandrou, Konstantinos and Masurkar, Amrita and Edrees, Hassan and Wishart, James F. and Hao, Yufeng and Petrone, Nicholas and Hone, James and Kymissis, Ioannis},
abstractNote = {Ionizing radiation poses a significant challenge to the operation and reliability of conventional silicon-based devices. In this paper, we report the effects of gamma radiation on graphene field-effect transistors (GFETs), along with a method to mitigate those effects by developing a radiation-hardened version of our back-gated GFETs. We demonstrate that activated atmospheric oxygen from the gamma ray interaction with air damages the semiconductor device, and damage to the substrate contributes additional threshold voltage instability. Our radiation-hardened devices, which have protection against these two effects, exhibit minimal performance degradation, improved stability, and significantly reduced hysteresis after prolonged gamma radiation exposure. Finally, we believe this work provides an insight into graphene's interactions with ionizing radiation that could enable future graphene-based electronic devices to be used for space, military, and other radiation-sensitive applications.},
doi = {10.1063/1.4963782},
journal = {Applied Physics Letters},
number = 15,
volume = 109,
place = {United States},
year = {Tue Oct 11 00:00:00 EDT 2016},
month = {Tue Oct 11 00:00:00 EDT 2016}
}
Web of Science
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