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This content will become publicly available on September 8, 2017

Title: Identification of lifetime limiting defects by temperature- and injection-dependent photoluminescence imaging

Authors:
 [1] ;  [2] ;  [3] ;  [1] ;  [1] ;  [1] ;  [4] ;  [5] ;  [4] ;  [2] ;  [2] ;  [1]
  1. Fraunhofer Institute for Solar Energy Systems, Heidenhofstraβe 2, D-79110 Freiburg, Germany
  2. Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
  3. Department of Materials Science and Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul 136-713, South Korea
  4. FUTURE-PV Innovation, Koriyama, Fukushima 963-0215, Japan
  5. Kyoto University, Yoshida-Honmachi, Sakyo-Ku, Kyoto 606-8501, Japan
Publication Date:
OSTI Identifier:
1322422
Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 120; Journal Issue: 10; Related Information: CHORUS Timestamp: 2016-09-08 13:49:42; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English