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Title: Extreme ultraviolet spectrometer based on a transmission electron microscopy grid

Here, we performed extreme ultraviolet spectroscopy using an 80 lines/mm transmission electron microscope mesh as the dispersive element. We also present the usefulness of this instrument for dispersing a high harmonic spectrum from the 13th to the 29th harmonic of a Ti:sapph laser, corresponding to a wavelength range from 60 to 27 nm. The resolution of the instrument is limited by the image size of the high harmonic generation region on the detector. Finally, the resolution in first order diffraction is under 2 nm over the entire spectral range with a resolving power around 30.
Authors:
 [1] ;  [2]
  1. SLAC National Accelerator Lab., Menlo Park, CA (United States); Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  2. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Publication Date:
OSTI Identifier:
1321440
Report Number(s):
LLNL-JRNL--686932
Journal ID: ISSN 2040-8978
Grant/Contract Number:
AC52-07NA27344
Type:
Accepted Manuscript
Journal Name:
Journal of Optics
Additional Journal Information:
Journal Volume: 17; Journal Issue: 1; Journal ID: ISSN 2040-8978
Publisher:
IOP Publishing
Research Org:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS high harmonic generation; extreme ultraviolet; ultrafast optics