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This content will become publicly available on December 17, 2016

Title: Software resilience and the effectiveness of software mitigation in microcontrollers

Commercially available microprocessors could be useful to the space community for noncritical computations. There are many possible components that are smaller, lower-power, and less expensive than traditional radiation-hardened microprocessors. Many commercial microprocessors have issues with single-event effects (SEEs), such as single-event upsets (SEUs) and single-event transients (SETs), that can cause the microprocessor to calculate an incorrect result or crash. In this paper we present the Trikaya technique for masking SEUs and SETs through software mitigation techniques. Furthermore, test results show that this technique can be very effective at masking errors, making it possible to fly these microprocessors for a variety of missions.
Authors:
 [1] ;  [1] ;  [1] ;  [1] ;  [1]
  1. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Publication Date:
OSTI Identifier:
1312570
Report Number(s):
LA-UR--15-25035
Journal ID: ISSN 0018-9499
Grant/Contract Number:
AC52-06NA25396
Type:
Accepted Manuscript
Journal Name:
IEEE Transactions on Nuclear Science
Additional Journal Information:
Journal Volume: 62; Journal Issue: 6; Conference: IEEE NSREC, Boston, MA (United States), 13 Jul 2015; Journal ID: ISSN 0018-9499
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Research Org:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
97 MATHEMATICS AND COMPUTING software fault tolerance; soft errors; software; software fault diagnosis