Software resilience and the effectiveness of software mitigation in microcontrollers

Quinn, Heather; Baker, Zachary; Fairbanks, Tom; Tripp, Justin L.; Duran, George

doi:10.1109/TNS.2015.2496342

Title: Software resilience and the effectiveness of software mitigation in microcontrollers

Abstract

Commercially available microprocessors could be useful to the space community for noncritical computations. There are many possible components that are smaller, lower-power, and less expensive than traditional radiation-hardened microprocessors. Many commercial microprocessors have issues with single-event effects (SEEs), such as single-event upsets (SEUs) and single-event transients (SETs), that can cause the microprocessor to calculate an incorrect result or crash. In this paper we present the Trikaya technique for masking SEUs and SETs through software mitigation techniques. Furthermore, test results show that this technique can be very effective at masking errors, making it possible to fly these microprocessors for a variety of missions.

Authors:

Quinn, Heather ^[1]; Baker, Zachary ^[1]; Fairbanks, Tom ^[1]; Tripp, Justin L. ^[1]; Duran, George ^[1]

Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

Publication Date:: Tue Dec 01 00:00:00 EST 2015

Research Org.:: Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1312570

Report Number(s):: LA-UR-15-25035
Journal ID: ISSN 0018-9499

Grant/Contract Number:: AC52-06NA25396

Resource Type:: Accepted Manuscript

Journal Name:: IEEE Transactions on Nuclear Science

Additional Journal Information:: Journal Volume: 62; Journal Issue: 6; Conference: IEEE NSREC, Boston, MA (United States), 13 Jul 2015; Journal ID: ISSN 0018-9499

Country of Publication:: United States

Language:: English

Subject:: 97 MATHEMATICS AND COMPUTING

Citation Formats


                    Quinn, Heather, Baker, Zachary, Fairbanks, Tom, Tripp, Justin L., and Duran, George. Software resilience and the effectiveness of software mitigation in microcontrollers.  United States: N. p., 2015. 
Web.  doi:10.1109/TNS.2015.2496342.

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                    Quinn, Heather, Baker, Zachary, Fairbanks, Tom, Tripp, Justin L., & Duran, George. Software resilience and the effectiveness of software mitigation in microcontrollers.  United States.  https://doi.org/10.1109/TNS.2015.2496342

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                    Quinn, Heather, Baker, Zachary, Fairbanks, Tom, Tripp, Justin L., and Duran, George. Tue .  
"Software resilience and the effectiveness of software mitigation in microcontrollers".  United States.  https://doi.org/10.1109/TNS.2015.2496342.  https://www.osti.gov/servlets/purl/1312570.

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@article{osti_1312570,

  title        = {Software resilience and the effectiveness of software mitigation in microcontrollers},

  author       = {Quinn, Heather and Baker, Zachary and Fairbanks, Tom and Tripp, Justin L. and Duran, George},

  abstractNote = {Commercially available microprocessors could be useful to the space community for noncritical computations. There are many possible components that are smaller, lower-power, and less expensive than traditional radiation-hardened microprocessors. Many commercial microprocessors have issues with single-event effects (SEEs), such as single-event upsets (SEUs) and single-event transients (SETs), that can cause the microprocessor to calculate an incorrect result or crash. In this paper we present the Trikaya technique for masking SEUs and SETs through software mitigation techniques. Furthermore, test results show that this technique can be very effective at masking errors, making it possible to fly these microprocessors for a variety of missions.},

  doi          = {10.1109/TNS.2015.2496342},

  journal      = {IEEE Transactions on Nuclear Science},

  number       = 6,

  volume       = 62,

  place        = {United States},

  year         = {Tue Dec 01 00:00:00 EST 2015},

  month        = {Tue Dec 01 00:00:00 EST 2015}

}

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https://doi.org/10.1109/TNS.2015.2496342

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Works referencing / citing this record:

Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems
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A Compact Model to Evaluate the Effects of High Level C++ Code Hardening in Radiation Environments
journal, June 2019

Reyneri, Leonardo Maria; Serrano-Cases, Alejandro; Morilla, Yolanda
Electronics, Vol. 8, Issue 6
DOI: 10.3390/electronics8060653

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