Using benchmarks for radiation testing of microprocessors and FPGAs
- Authors:
-
- Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
- Vanderbilt Univ., Nashville, TN (United States)
- Univ. Federal do Rio Grande do Sul, Porto Alegre (Brasil)
- Univ. de Sevilla, Sevilla (Spain)
- Stellenbosch Univ., Stellenbosch (South Africa)
- Politecnico di Torino, Torino (Italy)
- Univ. Carlos III de Madrid, Madrid (Spain)
- California Institute of Technology, Pasadena, CA (United States)
- Northeastern Univ., Boston, MA (United States)
- Brigham Young Univ., Provo, UT (United States)
- Publication Date:
- Research Org.:
- Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1312569
- Alternate Identifier(s):
- OSTI ID: 1356128
- Report Number(s):
- LA-UR-15-24958; LA-UR-15-28660
Journal ID: ISSN 0018-9499
- Grant/Contract Number:
- AC52-06NA25396
- Resource Type:
- Accepted Manuscript
- Journal Name:
- IEEE Transactions on Nuclear Science
- Additional Journal Information:
- Journal Volume: 62; Journal Issue: 6; Conference: IEEE NSREC, Boston, MA (United States), 13 Jul 2015; Journal ID: ISSN 0018-9499
- Publisher:
- Institute of Electrical and Electronics Engineers (IEEE)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 97 MATHEMATICS AND COMPUTING; software fault tolerance; Field-programmable gate arrays (FPGAs); soft error rates; soft errors
Citation Formats
Quinn, Heather, Robinson, William H., Rech, Paolo, Aguirre, Miguel, Barnard, Arno, Desogus, Marco, Entrena, Luis, Garcia-Valderas, Mario, Guertin, Steven M., Kaeli, David, Kastensmidt, Fernanda Lima, Kiddie, Bradley T., Sanchez-Clemente, Antonio, Reorda, Matteo Sonza, Sterpone, Luca, and Wirthlin, Michael. Using benchmarks for radiation testing of microprocessors and FPGAs. United States: N. p., 2015.
Web. doi:10.1109/TNS.2015.2498313.
Quinn, Heather, Robinson, William H., Rech, Paolo, Aguirre, Miguel, Barnard, Arno, Desogus, Marco, Entrena, Luis, Garcia-Valderas, Mario, Guertin, Steven M., Kaeli, David, Kastensmidt, Fernanda Lima, Kiddie, Bradley T., Sanchez-Clemente, Antonio, Reorda, Matteo Sonza, Sterpone, Luca, & Wirthlin, Michael. Using benchmarks for radiation testing of microprocessors and FPGAs. United States. https://doi.org/10.1109/TNS.2015.2498313
Quinn, Heather, Robinson, William H., Rech, Paolo, Aguirre, Miguel, Barnard, Arno, Desogus, Marco, Entrena, Luis, Garcia-Valderas, Mario, Guertin, Steven M., Kaeli, David, Kastensmidt, Fernanda Lima, Kiddie, Bradley T., Sanchez-Clemente, Antonio, Reorda, Matteo Sonza, Sterpone, Luca, and Wirthlin, Michael. Thu .
"Using benchmarks for radiation testing of microprocessors and FPGAs". United States. https://doi.org/10.1109/TNS.2015.2498313. https://www.osti.gov/servlets/purl/1312569.
@article{osti_1312569,
title = {Using benchmarks for radiation testing of microprocessors and FPGAs},
author = {Quinn, Heather and Robinson, William H. and Rech, Paolo and Aguirre, Miguel and Barnard, Arno and Desogus, Marco and Entrena, Luis and Garcia-Valderas, Mario and Guertin, Steven M. and Kaeli, David and Kastensmidt, Fernanda Lima and Kiddie, Bradley T. and Sanchez-Clemente, Antonio and Reorda, Matteo Sonza and Sterpone, Luca and Wirthlin, Michael},
abstractNote = {},
doi = {10.1109/TNS.2015.2498313},
journal = {IEEE Transactions on Nuclear Science},
number = 6,
volume = 62,
place = {United States},
year = {Thu Dec 17 00:00:00 EST 2015},
month = {Thu Dec 17 00:00:00 EST 2015}
}
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