Nanoforging Single Layer MoSe2 Through Defect Engineering with Focused Helium Ion Beams
Abstract
Development of devices and structures based on the layered 2D materials critically hinges on the capability to induce, control, and tailor the electronic, transport, and optoelectronic properties via defect engineering, much like doping strategies have enabled semiconductor electronics and forging enabled introduction of iron age. Here, we demonstrate the use of a scanning helium ion microscope (HIM) for tailoring the functionality of single layer MoSe2 locally, and decipher associated mechanisms at atomic level. We demonstrate He+ beam bombardment that locally creates vacancies, shifts the Fermi energy landscape and thereby increases the Young s modulus of elasticity. Furthermore, we observe for the first time, an increase in the B-exciton photoluminescence signal from the nanoforged regions at room temperature. In conclusion, the approach for precise defect engineering demonstrated here opens opportunities for creating functional 2D optoelectronic devices with a wide range of customizable properties that include operating in the visible region.
- Authors:
-
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS); Univ. of Tennessee, Knoxville, TN (United States). Dept. of Materials Science and Engineering; Procter and Gamble Company Winton Hill Business Center (WBHC), Cincinnati, OH (United States)
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS)
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Inst. for Functional Imaging of Materials
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS); Univ. of Tennessee, Knoxville, TN (United States). Dept. of Materials Science and Engineering
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Inst. for Functional Imaging of Materials; Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Computer Science & Mathematics Division
- Publication Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1311234
- Grant/Contract Number:
- AC05-00OR22725
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Scientific Reports
- Additional Journal Information:
- Journal Volume: 6; Journal ID: ISSN 2045-2322
- Publisher:
- Nature Publishing Group
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING
Citation Formats
Iberi, Vighter, Liang, Liangbo, Ievlev, Anton V., Stanford, Michael G., Lin, Ming-Wei, Li, Xufan, Mahjouri-Samani, Masoud, Jesse, Stephen, Sumpter, Bobby G., Kalinin, Sergei V., Joy, David C., Xiao, Kai, Belianinov, Alex, and Ovchinnikova, Olga S. Nanoforging Single Layer MoSe2 Through Defect Engineering with Focused Helium Ion Beams. United States: N. p., 2016.
Web. doi:10.1038/srep30481.
Iberi, Vighter, Liang, Liangbo, Ievlev, Anton V., Stanford, Michael G., Lin, Ming-Wei, Li, Xufan, Mahjouri-Samani, Masoud, Jesse, Stephen, Sumpter, Bobby G., Kalinin, Sergei V., Joy, David C., Xiao, Kai, Belianinov, Alex, & Ovchinnikova, Olga S. Nanoforging Single Layer MoSe2 Through Defect Engineering with Focused Helium Ion Beams. United States. https://doi.org/10.1038/srep30481
Iberi, Vighter, Liang, Liangbo, Ievlev, Anton V., Stanford, Michael G., Lin, Ming-Wei, Li, Xufan, Mahjouri-Samani, Masoud, Jesse, Stephen, Sumpter, Bobby G., Kalinin, Sergei V., Joy, David C., Xiao, Kai, Belianinov, Alex, and Ovchinnikova, Olga S. Tue .
"Nanoforging Single Layer MoSe2 Through Defect Engineering with Focused Helium Ion Beams". United States. https://doi.org/10.1038/srep30481. https://www.osti.gov/servlets/purl/1311234.
@article{osti_1311234,
title = {Nanoforging Single Layer MoSe2 Through Defect Engineering with Focused Helium Ion Beams},
author = {Iberi, Vighter and Liang, Liangbo and Ievlev, Anton V. and Stanford, Michael G. and Lin, Ming-Wei and Li, Xufan and Mahjouri-Samani, Masoud and Jesse, Stephen and Sumpter, Bobby G. and Kalinin, Sergei V. and Joy, David C. and Xiao, Kai and Belianinov, Alex and Ovchinnikova, Olga S.},
abstractNote = {Development of devices and structures based on the layered 2D materials critically hinges on the capability to induce, control, and tailor the electronic, transport, and optoelectronic properties via defect engineering, much like doping strategies have enabled semiconductor electronics and forging enabled introduction of iron age. Here, we demonstrate the use of a scanning helium ion microscope (HIM) for tailoring the functionality of single layer MoSe2 locally, and decipher associated mechanisms at atomic level. We demonstrate He+ beam bombardment that locally creates vacancies, shifts the Fermi energy landscape and thereby increases the Young s modulus of elasticity. Furthermore, we observe for the first time, an increase in the B-exciton photoluminescence signal from the nanoforged regions at room temperature. In conclusion, the approach for precise defect engineering demonstrated here opens opportunities for creating functional 2D optoelectronic devices with a wide range of customizable properties that include operating in the visible region.},
doi = {10.1038/srep30481},
journal = {Scientific Reports},
number = ,
volume = 6,
place = {United States},
year = {Tue Aug 02 00:00:00 EDT 2016},
month = {Tue Aug 02 00:00:00 EDT 2016}
}
Web of Science
Works referenced in this record:
Multifrequency Imaging in the Intermittent Contact Mode of Atomic Force Microscopy: Beyond Phase Imaging
journal, February 2012
- Guo, Senli; Solares, Santiago D.; Mochalin, Vadym
- Small, Vol. 8, Issue 8
Strong Photoluminescence Enhancement of MoS 2 through Defect Engineering and Oxygen Bonding
journal, May 2014
- Nan, Haiyan; Wang, Zilu; Wang, Wenhui
- ACS Nano, Vol. 8, Issue 6
Activating and optimizing MoS2 basal planes for hydrogen evolution through the formation of strained sulphur vacancies
journal, November 2015
- Li, Hong; Tsai, Charlie; Koh, Ai Leen
- Nature Materials, Vol. 15, Issue 1
Nanoscale effects in focused ion beam processing
journal, May 2003
- Frey, L.; Lehrer, C.; Ryssel, H.
- Applied Physics A: Materials Science & Processing, Vol. 76, Issue 7
Precision cutting and patterning of graphene with helium ions
journal, October 2009
- Bell, D. C.; Lemme, M. C.; Stern, L. A.
- Nanotechnology, Vol. 20, Issue 45
Scanning-helium-ion-beam lithography with hydrogen silsesquioxane resist
journal, January 2009
- Winston, D.; Cord, B. M.; Ming, B.
- Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 27, Issue 6
Metal dichalcogenide nanosheets: preparation, properties and applications
journal, January 2013
- Huang, Xiao; Zeng, Zhiyuan; Zhang, Hua
- Chemical Society Reviews, Vol. 42, Issue 5, p. 1934-1946
Helium ion microscopy of graphene: beam damage, image quality and edge contrast
journal, July 2013
- Fox, D.; Zhou, Y. B.; O’Neill, A.
- Nanotechnology, Vol. 24, Issue 33
Atomically Thin A New Direct-Gap Semiconductor
journal, September 2010
- Mak, Kin Fai; Lee, Changgu; Hone, James
- Physical Review Letters, Vol. 105, Issue 13, Article No.136805
Electronic and thermoelectric properties of assembled graphene nanoribbons with elastic strain and structural dislocation
journal, April 2013
- Liang, Liangbo; Meunier, Vincent
- Applied Physics Letters, Vol. 102, Issue 14
Size and Chirality Dependent Elastic Properties of Graphene Nanoribbons under Uniaxial Tension
journal, August 2009
- Zhao, H.; Min, K.; Aluru, N. R.
- Nano Letters, Vol. 9, Issue 8
Electrical control of neutral and charged excitons in a monolayer semiconductor
journal, February 2013
- Ross, Jason S.; Wu, Sanfeng; Yu, Hongyi
- Nature Communications, Vol. 4, Issue 1
Maskless Lithography and in situ Visualization of Conductivity of Graphene using Helium Ion Microscopy
journal, July 2015
- Iberi, Vighter; Vlassiouk, Ivan; Zhang, X. -G.
- Scientific Reports, Vol. 5, Issue 1
Measurement of the Elastic Properties and Intrinsic Strength of Monolayer Graphene
journal, July 2008
- Lee, C.; Wei, X.; Kysar, J. W.
- Science, Vol. 321, Issue 5887, p. 385-388
Two-Dimensional Nanosheets Produced by Liquid Exfoliation of Layered Materials
journal, February 2011
- Coleman, J. N.; Lotya, M.; O'Neill, A.
- Science, Vol. 331, Issue 6017, p. 568-571
Electronic structure of , , and . II. The nature of the optical band gaps
journal, April 1987
- Coehoorn, R.; Haas, C.; de Groot, R. A.
- Physical Review B, Vol. 35, Issue 12
Two-Dimensional Transition Metal Dichalcogenides under Electron Irradiation: Defect Production and Doping
journal, July 2012
- Komsa, Hannu-Pekka; Kotakoski, Jani; Kurasch, Simon
- Physical Review Letters, Vol. 109, Issue 3
Defect Control and n -Doping of Encapsulated Graphene by Helium-Ion-Beam Irradiation
journal, May 2015
- Nanda, Gaurav; Goswami, Srijit; Watanabe, Kenji
- Nano Letters, Vol. 15, Issue 6
Efficiency of ab-initio total energy calculations for metals and semiconductors using a plane-wave basis set
journal, July 1996
- Kresse, G.; Furthmüller, J.
- Computational Materials Science, Vol. 6, Issue 1, p. 15-50
Defects activated photoluminescence in two-dimensional semiconductors: interplay between bound, charged and free excitons
journal, September 2013
- Tongay, Sefaattin; Suh, Joonki; Ataca, Can
- Scientific Reports, Vol. 3, Issue 1
Open loop Kelvin probe force microscopy with single and multi-frequency excitation
journal, October 2013
- Collins, L.; Kilpatrick, J. I.; Weber, S. A. L.
- Nanotechnology, Vol. 24, Issue 47
Defect-Induced Photoluminescence in Monolayer Semiconducting Transition Metal Dichalcogenides
journal, January 2015
- Chow, Philippe K.; Jacobs-Gedrim, Robin B.; Gao, Jian
- ACS Nano, Vol. 9, Issue 2
WSXM : A software for scanning probe microscopy and a tool for nanotechnology
journal, January 2007
- Horcas, I.; Fernández, R.; Gómez-Rodríguez, J. M.
- Review of Scientific Instruments, Vol. 78, Issue 1
Focused helium-ion beam irradiation effects on electrical transport properties of few-layer WSe2: enabling nanoscale direct write homo-junctions
journal, June 2016
- Stanford, Michael G.; Pudasaini, Pushpa Raj; Belianinov, Alex
- Scientific Reports, Vol. 6, Issue 1
Helium ion microscopy of graphene: beam damage, image quality and edge contrast
journal, July 2013
- Fox, D.; Zhou, Y. B.; O’Neill, A.
- Nanotechnology, Vol. 24, Issue 33
Beam induced deposition of platinum using a helium ion microscope
journal, January 2009
- Sanford, Colin A.; Stern, Lewis; Barriss, Louise
- Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 27, Issue 6
Identification of phases, symmetries and defects through local crystallography
journal, July 2015
- Belianinov, Alex; He, Qian; Kravchenko, Mikhail
- Nature Communications, Vol. 6, Issue 1
The chemistry of two-dimensional layered transition metal dichalcogenide nanosheets
journal, April 2013
- Chhowalla, Manish; Shin, Hyeon Suk; Eda, Goki
- Nature Chemistry, Vol. 5, Issue 4, p. 263-275
Digital Transfer Growth of Patterned 2D Metal Chalcogenides by Confined Nanoparticle Evaporation
journal, October 2014
- Mahjouri-Samani, Masoud; Tian, Mengkun; Wang, Kai
- ACS Nano, Vol. 8, Issue 11, p. 11567-11575
Helium ion microscopy
journal, March 2014
- Hlawacek, Gregor; Veligura, Vasilisa; van Gastel, Raoul
- Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Vol. 32, Issue 2
Nanopatterning and Electrical Tuning of MoS 2 Layers with a Subnanometer Helium Ion Beam
journal, July 2015
- Fox, Daniel S.; Zhou, Yangbo; Maguire, Pierce
- Nano Letters, Vol. 15, Issue 8
Hopping transport through defect-induced localized states in molybdenum disulphide
journal, October 2013
- Qiu, Hao; Xu, Tao; Wang, Zilu
- Nature Communications, Vol. 4, Issue 1
Limitations of focused ion beam nanomachining
journal, January 2001
- Lehrer, C.; Frey, L.; Petersen, S.
- Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 19, Issue 6
Pulsed Laser Deposition of Photoresponsive Two-Dimensional GaSe Nanosheet Networks
journal, August 2014
- Mahjouri-Samani, Masoud; Gresback, Ryan; Tian, Mengkun
- Advanced Functional Materials, Vol. 24, Issue 40, p. 6365-6371
Strong Photoluminescence Enhancement of MoS 2 through Defect Engineering and Oxygen Bonding
journal, May 2014
- Nan, Haiyan; Wang, Zilu; Wang, Wenhui
- ACS Nano, Vol. 8, Issue 6
Multifrequency Imaging in the Intermittent Contact Mode of Atomic Force Microscopy: Beyond Phase Imaging
journal, February 2012
- Guo, Senli; Solares, Santiago D.; Mochalin, Vadym
- Small, Vol. 8, Issue 8
Hall and field-effect mobilities in few layered p-WSe2 field-effect transistors
journal, March 2015
- Pradhan, N. R.; Rhodes, D.; Memaran, S.
- Scientific Reports, Vol. 5, Issue 1
Ion-beam sculpting at nanometre length scales
journal, July 2001
- Li, Jiali; Stein, Derek; McMullan, Ciaran
- Nature, Vol. 412, Issue 6843, p. 166-169
Two-dimensional transition metal dichalcogenides under electron irradiation: defect production and doping
text, January 2012
- Komsa, Hannu-Pekka; Kotakoski, Jani; Kurasch, Simon
- arXiv
Raman vibrational spectra of bulk to monolayer with lower symmetry
journal, August 2015
- Feng, Yanqing; Zhou, Wei; Wang, Yaojia
- Physical Review B, Vol. 92, Issue 5
Helium Ion Microscopy
text, January 2013
- Hlawacek, Gregor; Veligura, Vasilisa; van Gastel, Raoul
- arXiv
Measurement of the Elastic Properties and Intrinsic Strength of Monolayer Graphene
journal, July 2008
- Lee, C.; Wei, X.; Kysar, J. W.
- Science, Vol. 321, Issue 5887, p. 385-388
Two-Dimensional Nanosheets Produced by Liquid Exfoliation of Layered Materials
journal, February 2011
- Coleman, J. N.; Lotya, M.; O'Neill, A.
- Science, Vol. 331, Issue 6017, p. 568-571
Maskless Lithography and in situ Visualization of Conductivity of Graphene using Helium Ion Microscopy
journal, July 2015
- Iberi, Vighter; Vlassiouk, Ivan; Zhang, X. -G.
- Scientific Reports, Vol. 5, Issue 1
Atomic Scale Microstructure and Properties of Se-Deficient Two-Dimensional MoSe 2
journal, February 2015
- Lehtinen, Ossi; Komsa, Hannu-Pekka; Pulkin, Artem
- ACS Nano, Vol. 9, Issue 3
Synthesis of Large-Area MoS2 Atomic Layers with Chemical Vapor Deposition
journal, March 2012
- Lee, Yi-Hsien; Zhang, Xin-Quan; Zhang, Wenjing
- Advanced Materials, Vol. 24, Issue 17, p. 2320-2325
Patterned arrays of lateral heterojunctions within monolayer two-dimensional semiconductors
journal, July 2015
- Mahjouri-Samani, Masoud; Lin, Ming-Wei; Wang, Kai
- Nature Communications, Vol. 6, Issue 1
Defect-Induced Photoluminescence in Monolayer Semiconducting Transition Metal Dichalcogenides
journal, January 2015
- Chow, Philippe K.; Jacobs-Gedrim, Robin B.; Gao, Jian
- ACS Nano, Vol. 9, Issue 2
Large excitonic effects in monolayers of molybdenum and tungsten dichalcogenides
journal, September 2012
- Ramasubramaniam, Ashwin
- Physical Review B, Vol. 86, Issue 11
Mechanical properties of nanosheets and nanotubes investigated using a new geometry independent volume definition
text, January 2013
- Wagner, Philipp; Ivanovskaya, Viktoria V.; Rayson, Mark J.
- arXiv
Better Catalysts through Microscopy: Mesoscale M1/M2 Intergrowth in Molybdenum–Vanadium Based Complex Oxide Catalysts for Propane Ammoxidation
journal, February 2015
- He, Qian; Woo, Jungwon; Belianinov, Alexei
- ACS Nano, Vol. 9, Issue 4
Solar-energy conversion and light emission in an atomic monolayer p–n diode
journal, March 2014
- Pospischil, Andreas; Furchi, Marco M.; Mueller, Thomas
- Nature Nanotechnology, Vol. 9, Issue 4
Using molecular dynamics to quantify the electrical double layer and examine the potential for its direct observation in the in-situ TEM
journal, March 2015
- Welch, David A.; Mehdi, B. Layla; Hatchell, Hannah J.
- Advanced Structural and Chemical Imaging, Vol. 1, Issue 1
Low-Frequency Raman Fingerprints of Two-Dimensional Metal Dichalcogenide Layer Stacking Configurations
journal, May 2015
- Puretzky, Alexander A.; Liang, Liangbo; Li, Xufan
- ACS Nano, Vol. 9, Issue 6
Nanoscale effects in focused ion beam processing
journal, May 2003
- Frey, L.; Lehrer, C.; Ryssel, H.
- Applied Physics A: Materials Science & Processing, Vol. 76, Issue 7
Emerging Device Applications for Semiconducting Two-Dimensional Transition Metal Dichalcogenides
text, January 2014
- Jariwala, Deep; Sangwan, Vinod K.; Lauhon, Lincoln J.
- arXiv
Defects activated photoluminescence in two-dimensional semiconductors: interplay between bound, charged and free excitons
journal, September 2013
- Tongay, Sefaattin; Suh, Joonki; Ataca, Can
- Scientific Reports, Vol. 3, Issue 1
Phonons in single-layer and few-layer MoS and WS
journal, October 2011
- Molina-Sánchez, A.; Wirtz, L.
- Physical Review B, Vol. 84, Issue 15
Open loop Kelvin probe force microscopy with single and multi-frequency excitation
journal, October 2013
- Collins, L.; Kilpatrick, J. I.; Weber, S. A. L.
- Nanotechnology, Vol. 24, Issue 47
Recent Advances in Two-Dimensional Materials beyond Graphene
journal, October 2015
- Bhimanapati, Ganesh R.; Lin, Zhong; Meunier, Vincent
- ACS Nano, Vol. 9, Issue 12
Erratum: Big data and deep data in scanning and electron microscopies: deriving functionality from multidimensional data sets
journal, August 2015
- Belianinov, Alex; Vasudevan, Rama; Strelcov, Evgheni
- Advanced Structural and Chemical Imaging, Vol. 1, Issue 1
Electromechanical and elastic probing of bacteria in a cell culture medium
journal, May 2012
- Thompson, G. L.; Reukov, V. V.; Nikiforov, M. P.
- Nanotechnology, Vol. 23, Issue 24
Probing the Interlayer Coupling of Twisted Bilayer MoS 2 Using Photoluminescence Spectroscopy
journal, September 2014
- Huang, Shengxi; Ling, Xi; Liang, Liangbo
- Nano Letters, Vol. 14, Issue 10
Nanopatterning and Electrical Tuning of MoS 2 Layers with a Subnanometer Helium Ion Beam
journal, July 2015
- Fox, Daniel S.; Zhou, Yangbo; Maguire, Pierce
- Nano Letters, Vol. 15, Issue 8
The chemistry of two-dimensional layered transition metal dichalcogenide nanosheets
journal, April 2013
- Chhowalla, Manish; Shin, Hyeon Suk; Eda, Goki
- Nature Chemistry, Vol. 5, Issue 4, p. 263-275
Electronics and optoelectronics of two-dimensional transition metal dichalcogenides
journal, November 2012
- Wang, Qing Hua; Kalantar-Zadeh, Kourosh; Kis, Andras
- Nature Nanotechnology, Vol. 7, Issue 11, p. 699-712
Patterned arrays of lateral heterojunctions within monolayer two-dimensional semiconductors
journal, July 2015
- Mahjouri-Samani, Masoud; Lin, Ming-Wei; Wang, Kai
- Nature Communications, Vol. 6, Issue 1
Digital Transfer Growth of Patterned 2D Metal Chalcogenides by Confined Nanoparticle Evaporation
journal, October 2014
- Mahjouri-Samani, Masoud; Tian, Mengkun; Wang, Kai
- ACS Nano, Vol. 8, Issue 11, p. 11567-11575
Surface nanopatterns induced by ion-beam sputtering
journal, May 2009
- Cuerno, Rodolfo; Vázquez, Luis; Gago, Raúl
- Journal of Physics: Condensed Matter, Vol. 21, Issue 22
Optoelectronic devices based on electrically tunable p–n diodes in a monolayer dichalcogenide
journal, March 2014
- Baugher, Britton W. H.; Churchill, Hugh O. H.; Yang, Yafang
- Nature Nanotechnology, Vol. 9, Issue 4
Synthesis of Large-Area MoS2 Atomic Layers with Chemical Vapor Deposition
journal, March 2012
- Lee, Yi-Hsien; Zhang, Xin-Quan; Zhang, Wenjing
- Advanced Materials, Vol. 24, Issue 17, p. 2320-2325
Emerging Device Applications for Semiconducting Two-Dimensional Transition Metal Dichalcogenides
journal, January 2014
- Jariwala, Deep; Sangwan, Vinod K.; Lauhon, Lincoln J.
- ACS Nano, Vol. 8, Issue 2
Limitations of focused ion beam nanomachining
journal, January 2001
- Lehrer, C.; Frey, L.; Petersen, S.
- Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 19, Issue 6
Low-Frequency Raman Fingerprints of Two-Dimensional Metal Dichalcogenide Layer Stacking Configurations
journal, May 2015
- Puretzky, Alexander A.; Liang, Liangbo; Li, Xufan
- ACS Nano, Vol. 9, Issue 6
Band Excitation in Scanning Probe Microscopy: Recognition and Functional Imaging
journal, April 2014
- Jesse, S.; Vasudevan, R. K.; Collins, L.
- Annual Review of Physical Chemistry, Vol. 65, Issue 1
Band excitation Kelvin probe force microscopy utilizing photothermal excitation
journal, March 2015
- Collins, Liam; Jesse, Stephen; Balke, Nina
- Applied Physics Letters, Vol. 106, Issue 10
Size and Chirality Dependent Elastic Properties of Graphene Nanoribbons under Uniaxial Tension
journal, August 2009
- Zhao, H.; Min, K.; Aluru, N. R.
- Nano Letters, Vol. 9, Issue 8
Beam induced deposition of platinum using a helium ion microscope
journal, January 2009
- Sanford, Colin A.; Stern, Lewis; Barriss, Louise
- Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 27, Issue 6
Focused helium-ion beam irradiation effects on electrical transport properties of few-layer WSe2: enabling nanoscale direct write homo-junctions
journal, June 2016
- Stanford, Michael G.; Pudasaini, Pushpa Raj; Belianinov, Alex
- Scientific Reports, Vol. 6, Issue 1
Atomic Scale Microstructure and Properties of Se-Deficient Two-Dimensional MoSe 2
journal, February 2015
- Lehtinen, Ossi; Komsa, Hannu-Pekka; Pulkin, Artem
- ACS Nano, Vol. 9, Issue 3
WSXM : A software for scanning probe microscopy and a tool for nanotechnology
journal, January 2007
- Horcas, I.; Fernández, R.; Gómez-Rodríguez, J. M.
- Review of Scientific Instruments, Vol. 78, Issue 1
Precision cutting and patterning of graphene with helium ions
journal, October 2009
- Bell, D. C.; Lemme, M. C.; Stern, L. A.
- Nanotechnology, Vol. 20, Issue 45
Recent Advances in Two-Dimensional Materials beyond Graphene
journal, October 2015
- Bhimanapati, Ganesh R.; Lin, Zhong; Meunier, Vincent
- ACS Nano, Vol. 9, Issue 12
Works referencing / citing this record:
Robust valley polarization of helium ion modified atomically thin MoS 2
journal, November 2017
- Klein, J.; Kuc, A.; Nolinder, A.
- 2D Materials, Vol. 5, Issue 1
Two-dimensional MoS 2 under ion irradiation: from controlled defect production to electronic structure engineering
journal, April 2017
- Ghorbani-Asl, Mahdi; Kretschmer, Silvan; Spearot, Douglas E.
- 2D Materials, Vol. 4, Issue 2
Suppression of the Shear Raman Mode in Defective Bilayer MoS2
text, January 2018
- Maguire, Pierce; Downing, Clive; Jadwiszczak, Jakub
- arXiv
Reversible crystalline-to-amorphous phase transformation in monolayer MoS 2 under grazing ion irradiation
journal, January 2020
- Valerius, Philipp; Kretschmer, Silvan; Senkovskiy, Boris V.
- 2D Materials, Vol. 7, Issue 2
Chemical Changes in Layered Ferroelectric Semiconductors Induced by Helium Ion Beam
journal, November 2017
- Belianinov, Alex; Burch, Matthew J.; Hysmith, Holland E.
- Scientific Reports, Vol. 7, Issue 1
Defect-moderated oxidative etching of MoS 2
journal, October 2019
- Maguire, Pierce; Jadwiszczak, Jakub; O’Brien, Maria
- Journal of Applied Physics, Vol. 126, Issue 16
Convergent ion beam alteration of 2D materials and metal-2D interfaces
journal, June 2019
- Cheng, Zhihui; Abuzaid, Hattan; Yu, Yifei
- 2D Materials, Vol. 6, Issue 3
Emerging nanofabrication and quantum confinement techniques for 2D materials beyond graphene
journal, July 2018
- Stanford, Michael G.; Rack, Philip D.; Jariwala, Deep
- npj 2D Materials and Applications, Vol. 2, Issue 1
Atomic structure of intrinsic and electron-irradiation-induced defects in MoTe2
text, January 2018
- Elibol, Kenan; Susi, Toma; Argentero, Giacomo
- arXiv
Suppression of the shear Raman mode in defective bilayer MoS 2
journal, February 2019
- Maguire, Pierce; Downing, Clive; Jadwiszczak, Jakub
- Journal of Applied Physics, Vol. 125, Issue 6
Molecular chemistry approaches for tuning the properties of two-dimensional transition metal dichalcogenides
journal, January 2018
- Bertolazzi, Simone; Gobbi, Marco; Zhao, Yuda
- Chemical Society Reviews, Vol. 47, Issue 17
Second-Harmonic Spectroscopy for Defects Engineering Monitoring in Transition Metal Dichalcogenides
journal, January 2018
- Rosa, Henrique G.; Junpeng, Lu; Gomes, Lídia C.
- Advanced Optical Materials, Vol. 6, Issue 5