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This content will become publicly available on July 26, 2017

Title: High temperature Hall measurement setup for thin film characterization

Authors:
 [1] ;  [1] ;  [1]
  1. Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA
Publication Date:
OSTI Identifier:
1272653
Grant/Contract Number:
FG02-10ER46774
Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 87; Journal Issue: 7; Related Information: CHORUS Timestamp: 2016-07-30 15:46:21; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English