Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

Borysov, Stanislav S.; Forchheimer, Daniel; Haviland, David B.

doi:10.3762/bjnano.5.200

Title: Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

Abstract

Here we present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever inverse responsivity) of a cantilever. The method is based on the tip–surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip–surface interaction. The calibration method proposed requires a single-point force measurement by using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode.

Authors:

Borysov, Stanislav S. ^[1]; Forchheimer, Daniel ^[2]; Haviland, David B. ^[2]

KTH Royal Inst. of Technology, Stockholm (Sweden); Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
KTH Royal Inst. of Technology, Stockholm (Sweden)

Publication Date:: Wed Oct 29 00:00:00 EDT 2014

Research Org.:: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1263563

Resource Type:: Accepted Manuscript

Journal Name:: Beilstein Journal of Nanotechnology

Additional Journal Information:: Journal Volume: 5; Journal ID: ISSN 2190-4286

Publisher:: Beilstein Institute

Country of Publication:: United States

Language:: English

Subject:: 74 ATOMIC AND MOLECULAR PHYSICS; atomic force microscopy; calibration; multimodal AFM; multifrequency AFM

Citation Formats


                    Borysov, Stanislav S., Forchheimer, Daniel, and Haviland, David B. Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions.  United States: N. p., 2014. 
Web.  doi:10.3762/bjnano.5.200.

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                    Borysov, Stanislav S., Forchheimer, Daniel, & Haviland, David B. Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions.  United States.  https://doi.org/10.3762/bjnano.5.200

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                    Borysov, Stanislav S., Forchheimer, Daniel, and Haviland, David B. Wed .  
"Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions".  United States.  https://doi.org/10.3762/bjnano.5.200.  https://www.osti.gov/servlets/purl/1263563.

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@article{osti_1263563,

  title        = {Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions},

  author       = {Borysov, Stanislav S. and Forchheimer, Daniel and Haviland, David B.},

  abstractNote = {Here we present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever inverse responsivity) of a cantilever. The method is based on the tip–surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip–surface interaction. The calibration method proposed requires a single-point force measurement by using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode.},

  doi          = {10.3762/bjnano.5.200},

  journal      = {Beilstein Journal of Nanotechnology},

  number       = ,

  volume       = 5,

  place        = {United States},

  year         = {Wed Oct 29 00:00:00 EDT 2014},

  month        = {Wed Oct 29 00:00:00 EDT 2014}

}

Copy to clipboard

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Title: Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

Abstract

Citation Formats

Atomic Force Microscope journal, March 1986

Interpretation of force curves in force microscopy journal, April 1993

Force measurements with the atomic force microscope: Technique, interpretation and applications journal, October 2005

Repulsive bimodal atomic force microscopy on polymers journal, January 2012

Multifrequency, repulsive-mode amplitude-modulated atomic force microscopy journal, September 2006

Enhanced compositional sensitivity in atomic force microscopy by the excitation of the first two flexural modes journal, October 2006

Nonlinear contact resonance spectroscopy in atomic force microscopy journal, November 2007

Theory of Multifrequency Atomic Force Microscopy journal, February 2008

Simultaneous measurement of lateral and normal forces with an optical‐beam‐deflection atomic force microscope journal, November 1990

A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy journal, February 1993

Calibration of atomic‐force microscope tips journal, July 1993

Method for the calibration of atomic force microscope cantilevers journal, July 1995

Noninvasive determination of optical lever sensitivity in atomic force microscopy journal, January 2006

Calculation of thermal noise in atomic force microscopy journal, January 1995

Calibration of rectangular atomic force microscope cantilevers journal, October 1999

Optical lever detection in higher eigenmode dynamic atomic force microscopy journal, November 2004

Calculation of thermal noise in an atomic force microscope with a finite optical spot size journal, March 2005

Optimization and calibration of atomic force microscopy sensitivity in terms of tip-sample interactions in high-order dynamic atomic force microscopy journal, December 2009

Determination of the spring constants of the higher flexural modes of microcantilever sensors journal, January 2013

On eigenmodes, stiffness, and sensitivity of atomic force microscope cantilevers in air versus liquids journal, February 2010

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Comparison of calibration methods for atomic-force microscopy cantilevers journal, December 2002

Calibration of higher eigenmode spring constants of atomic force microscope cantilevers journal, October 2010

Intermodulation atomic force microscopy journal, April 2008

Reconstruction of tip-surface interactions with multimodal intermodulation atomic force microscopy journal, September 2013

Dynamic force spectroscopy using cantilever higher flexural modes journal, August 2007

Drift compensation for automatic nanomanipulation with scanning probe microscopes journal, July 2006

Polynomial force approximations and multifrequency atomic force microscopy journal, January 2013

SUNDIALS: Suite of nonlinear and differential/algebraic equation solvers journal, September 2005

Effect of contact deformations on the adhesion of particles journal, November 1975

Conservative and dissipative tip-sample interaction forces probed with dynamic AFM journal, October 1999

Atomic Force Microscopy in Liquid book, April 2012

Effect of contact deformations on the adhesion of particles journal, January 1994

Atomic Force Microscope. [原子間力顕微鏡] journal, January 1991

Reconstruction of Tip-Surface Interactions with Multimodal Intermodulation Atomic Force Microscopy text, January 2013

Atomic Force Microscope
journal, March 1986

Interpretation of force curves in force microscopy
journal, April 1993

Force measurements with the atomic force microscope: Technique, interpretation and applications
journal, October 2005

Repulsive bimodal atomic force microscopy on polymers
journal, January 2012

Multifrequency, repulsive-mode amplitude-modulated atomic force microscopy
journal, September 2006

Enhanced compositional sensitivity in atomic force microscopy by the excitation of the first two flexural modes
journal, October 2006

Nonlinear contact resonance spectroscopy in atomic force microscopy
journal, November 2007

Theory of Multifrequency Atomic Force Microscopy
journal, February 2008

Simultaneous measurement of lateral and normal forces with an optical‐beam‐deflection atomic force microscope
journal, November 1990

A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy
journal, February 1993

Calibration of atomic‐force microscope tips
journal, July 1993

Method for the calibration of atomic force microscope cantilevers
journal, July 1995

Noninvasive determination of optical lever sensitivity in atomic force microscopy
journal, January 2006

Calculation of thermal noise in atomic force microscopy
journal, January 1995

Calibration of rectangular atomic force microscope cantilevers
journal, October 1999

Optical lever detection in higher eigenmode dynamic atomic force microscopy
journal, November 2004

Calculation of thermal noise in an atomic force microscope with a finite optical spot size
journal, March 2005

Optimization and calibration of atomic force microscopy sensitivity in terms of tip-sample interactions in high-order dynamic atomic force microscopy
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Determination of the spring constants of the higher flexural modes of microcantilever sensors
journal, January 2013

On eigenmodes, stiffness, and sensitivity of atomic force microscope cantilevers in air versus liquids
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Conservative and dissipative tip-sample interaction forces probed with dynamic AFM
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