Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: Coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions
Abstract
Significant progress has been accomplished in the development of experimental contact-mode and dynamic-mode atomic force microscopy (AFM) methods designed to measure surface material properties. However, current methods are based on one-dimensional (1D) descriptions of the tip-sample interaction forces, thus neglecting the intricacies involved in the material behavior of complex samples (such as soft viscoelastic materials) as well as the differences in material response between the surface and the bulk. In order to begin to address this gap, a computational study is presented where the sample is simulated using an enhanced version of a recently introduced model that treats the surface as a collection of standard-linear-solid viscoelastic elements. The enhanced model introduces in-plane surface elastic forces that can be approximately related to a two-dimensional (2D) Young's modulus. Relevant cases are discussed for single-and multifrequency intermittent-contact AFM imaging, with focus on the calculated surface indentation profiles and tip-sample interaction force curves, as well as their implications with regards to experimental interpretation. A variety of phenomena are examined in detail, which highlight the need for further development of more physically accurate sample models that are specifically designed for AFM simulation. As a result, a multifrequency AFM simulation tool based on the above samplemore »
- Authors:
-
- George Washington Univ., Washington, DC (United States)
- Publication Date:
- Research Org.:
- George Washington Univ., Washington, DC (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1262033
- Grant/Contract Number:
- SC0011912
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Beilstein Journal of Nanotechnology
- Additional Journal Information:
- Journal Volume: 7; Journal ID: ISSN 2190-4286
- Publisher:
- Beilstein Institute
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; atomic force microscopy; modeling; polymers; simulation; spectroscopy; standard linear solid; surface elasticity; surface energy; viscoelasticity; SI(111)-7X7
Citation Formats
Solares, Santiago D. Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: Coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions. United States: N. p., 2016.
Web. doi:10.3762/bjnano.7.49.
Solares, Santiago D. Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: Coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions. United States. https://doi.org/10.3762/bjnano.7.49
Solares, Santiago D. Fri .
"Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: Coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions". United States. https://doi.org/10.3762/bjnano.7.49. https://www.osti.gov/servlets/purl/1262033.
@article{osti_1262033,
title = {Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: Coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions},
author = {Solares, Santiago D.},
abstractNote = {Significant progress has been accomplished in the development of experimental contact-mode and dynamic-mode atomic force microscopy (AFM) methods designed to measure surface material properties. However, current methods are based on one-dimensional (1D) descriptions of the tip-sample interaction forces, thus neglecting the intricacies involved in the material behavior of complex samples (such as soft viscoelastic materials) as well as the differences in material response between the surface and the bulk. In order to begin to address this gap, a computational study is presented where the sample is simulated using an enhanced version of a recently introduced model that treats the surface as a collection of standard-linear-solid viscoelastic elements. The enhanced model introduces in-plane surface elastic forces that can be approximately related to a two-dimensional (2D) Young's modulus. Relevant cases are discussed for single-and multifrequency intermittent-contact AFM imaging, with focus on the calculated surface indentation profiles and tip-sample interaction force curves, as well as their implications with regards to experimental interpretation. A variety of phenomena are examined in detail, which highlight the need for further development of more physically accurate sample models that are specifically designed for AFM simulation. As a result, a multifrequency AFM simulation tool based on the above sample model is provided as supporting information.},
doi = {10.3762/bjnano.7.49},
journal = {Beilstein Journal of Nanotechnology},
number = ,
volume = 7,
place = {United States},
year = {Fri Apr 15 00:00:00 EDT 2016},
month = {Fri Apr 15 00:00:00 EDT 2016}
}
Web of Science
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Viscoelastic Property Mapping with Contact Resonance Force Microscopy
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Nanoscale Interfacial Friction and Adhesion on Supported versus Suspended Monolayer and Multilayer Graphene
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Probing of Polymer Surfaces in the Viscoelastic Regime
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Fast nanomechanical spectroscopy of soft matter
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An atomic force microscope tip designed to measure time-varying nanomechanical forces
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Dynamic force microscopy simulator (dForce): A tool for planning and understanding tapping and bimodal AFM experiments
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- Guzman, Horacio V.; Garcia, Pablo D.; Garcia, Ricardo
- Beilstein Journal of Nanotechnology, Vol. 6
Works referencing / citing this record:
Calculation of standard viscoelastic responses with multiple retardation times through analysis of static force spectroscopy AFM data
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Transverse viscoelastic properties of pulp fibers investigated with an atomic force microscopy method
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Material property analytical relations for the case of an AFM probe tapping a viscoelastic surface containing multiple characteristic times
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