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Title: Talbot-Lau X-ray Deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments

Talbot-Lau X-ray Deflectometry has been developed as an electron density diagnostic for High Energy Density plasmas. The technique can deliver x-ray refraction, attenuation, elemental composition, and scatter information from a single Moiré image. An 8 keV Talbot-Lau interferometer was deployed using laser and x-pinch backlighters. Grating survival and electron density mapping was demonstrated for 25-29 J, 8-30 ps laser pulses using copper foil targets. Moire pattern formation and grating survival was also observed using a copper x-pinch driven at 400 kA, ~1 kA/ns. Lastly, these results demonstrate the potential of TXD as an electron density diagnostic for HED plasmas.
Authors:
 [1] ;  [1] ;  [2] ;  [2] ;  [2] ;  [2] ;  [2] ;  [2] ;  [3] ;  [4] ;  [4] ;  [4] ;  [4]
  1. Johns Hopkins Univ., Baltimore, MD (United States)
  2. Univ. of Rochester, Rochester, NY (United States)
  3. Univ. of Michigan, Ann Arbor, MI (United States)
  4. Pontificia Univ. Catolica de Chile, Santiago (Chile)
Publication Date:
OSTI Identifier:
1258592
Grant/Contract Number:
NA0002955
Type:
Accepted Manuscript
Journal Name:
IEEE Transactions on Plasma Science
Additional Journal Information:
Journal Name: IEEE Transactions on Plasma Science; Journal ID: ISSN 0093-3813
Publisher:
IEEE
Research Org:
Johns Hopkins Univ., Baltimore, MD (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English
Subject:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY X-ray imaging; refraction diagnostics; High-energy (HED) diagnostic