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This content will become publicly available on May 9, 2017

Title: G-mode magnetic force microscopy: Separating magnetic and electrostatic interactions using big data analytics

We develop a full information capture approach for Magnetic Force Microscopy (MFM), referred to as generalized mode (G-Mode) MFM. G-Mode MFM acquires and stores the full data stream from the photodetector at sampling rates approaching the intrinsic photodiode limit. The data can be subsequently compressed, denoised, and analyzed, without information loss. Also, 3 G-Mode MFM is implemented and compared to traditional heterodyne based MFM on model systems including domain structures in ferromagnetic Yttrium Iron Garnet (YIG) and electronically and magnetically inhomogeneous high entropy alloy, CoFeMnNiSn. We investigate the use of information theory to mine the G-Mode MFM data and demonstrate its usefulness for extracting information which may be hidden in traditional MFM modes, including signatures of nonlinearities and mode coupling phenomena. Finally we demonstrate detection and separation of magnetic and electrostatic tip-sample interactions from a single G-Mode image, by analyzing the entire frequency response of the cantilever. G-Mode MFM is immediately implementable on any AFM platform and as such is expected to be a useful technique for probing spatiotemporal cantilever dynamics and mapping material properties as well as their mutual interactions.
Authors:
 [1] ;  [1] ;  [2] ;  [3] ;  [4] ;  [5] ;  [1] ;  [1]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  2. Asylum Research, Santa Barbara, CA (United States)
  3. Univ. of Science and Technology, Beijing (China); Univ. of Tennessee, Knoxville, TN (United States)
  4. Univ. of Science and Technology, Beijing (China)
  5. Univ. of Tennessee, Knoxville, TN (United States)
Publication Date:
OSTI Identifier:
1257904
Grant/Contract Number:
AC05-00OR22725
Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 108; Journal Issue: 19; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Research Org:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org:
USDOE Office of Science (SC)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE