Accurate determination of the total hemispherical emittance and solar absorptance of opaque surfaces at elevated temperatures
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Energy Efficiency and Renewable Energy (EERE)
- OSTI Identifier:
- 1254667
- Grant/Contract Number:
- SC0001299; FG02–09ER46577; EE0005806
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Solar Energy Materials and Solar Cells
- Additional Journal Information:
- Journal Name: Solar Energy Materials and Solar Cells Journal Volume: 132 Journal Issue: C; Journal ID: ISSN 0927-0248
- Publisher:
- Elsevier
- Country of Publication:
- Netherlands
- Language:
- English
Citation Formats
Kraemer, Daniel, McEnaney, Kenneth, Cao, Feng, Ren, Zhifeng, and Chen, Gang. Accurate determination of the total hemispherical emittance and solar absorptance of opaque surfaces at elevated temperatures. Netherlands: N. p., 2015.
Web. doi:10.1016/j.solmat.2014.10.026.
Kraemer, Daniel, McEnaney, Kenneth, Cao, Feng, Ren, Zhifeng, & Chen, Gang. Accurate determination of the total hemispherical emittance and solar absorptance of opaque surfaces at elevated temperatures. Netherlands. https://doi.org/10.1016/j.solmat.2014.10.026
Kraemer, Daniel, McEnaney, Kenneth, Cao, Feng, Ren, Zhifeng, and Chen, Gang. Thu .
"Accurate determination of the total hemispherical emittance and solar absorptance of opaque surfaces at elevated temperatures". Netherlands. https://doi.org/10.1016/j.solmat.2014.10.026.
@article{osti_1254667,
title = {Accurate determination of the total hemispherical emittance and solar absorptance of opaque surfaces at elevated temperatures},
author = {Kraemer, Daniel and McEnaney, Kenneth and Cao, Feng and Ren, Zhifeng and Chen, Gang},
abstractNote = {},
doi = {10.1016/j.solmat.2014.10.026},
journal = {Solar Energy Materials and Solar Cells},
number = C,
volume = 132,
place = {Netherlands},
year = {Thu Jan 01 00:00:00 EST 2015},
month = {Thu Jan 01 00:00:00 EST 2015}
}
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1016/j.solmat.2014.10.026
https://doi.org/10.1016/j.solmat.2014.10.026
Other availability
Cited by: 16 works
Citation information provided by
Web of Science
Web of Science
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
The measurement of optical properties of selective surfaces using a solar calorimeter
journal, January 1978
- Willrath, H.; Gammon, R. B.
- Solar Energy, Vol. 21, Issue 3
A new transient temperature emissometer
journal, December 1980
- Willrath, H.; Smith, G. B.
- Solar Energy Materials, Vol. 4, Issue 1
Effects of Roughness of Metal Surfaces on Angular Distribution of Monochromatic Reflected Radiation
journal, February 1965
- Birkebak, R. C.; Eckert, E. R. G.
- Journal of Heat Transfer, Vol. 87, Issue 1
A review of cermet-based spectrally selective solar absorbers
journal, January 2014
- Cao, Feng; McEnaney, Kenneth; Chen, Gang
- Energy & Environmental Science, Vol. 7, Issue 5
Fourier Transform Infrared System Measurement of the Bidirectional Reflectivity of Diffuse and Grooved Surfaces
journal, November 1995
- Ford, J. N.; Tang, K.; Buckius, R. O.
- Journal of Heat Transfer, Vol. 117, Issue 4
Survey of infrared measurement techniques and computational methods in radiant heat transfer. transfer.
journal, July 1966
- Dunn, S. Thomas; Richmond, Joseph C.; Parmer, Jerome F.
- Journal of Spacecraft and Rockets, Vol. 3, Issue 7
Measurement of total reflectance, transmittance and emissivity over the thermal IR spectrum
journal, February 1985
- Clarke, F. J. J.; Larkin, J. A.
- Infrared Physics, Vol. 25, Issue 1-2
The total hemispherical emissivity of copper
journal, January 1978
- Smalley, R.; Sievers, A. J.
- Journal of the Optical Society of America, Vol. 68, Issue 11
Total emissivity measurements without use of an absolute reference
journal, December 1996
- Especel, D.; Matteï, S.
- Infrared Physics & Technology, Vol. 37, Issue 7
An emissometer with high accuracy for determination of the total hemispherical emittance of surfaces
journal, August 1980
- Beens, W. W.; Sikkens, M.; Verster, J. L.
- Journal of Physics E: Scientific Instruments, Vol. 13, Issue 8
A calorimetric technique for measuring total emissivity of solid materials and coatings at low temperatures
journal, December 1979
- Giulietti, D.; Gozzini, A.; Lucchesi, M.
- Journal of Physics D: Applied Physics, Vol. 12, Issue 12
Measurement of emittance and absorptance of selected materials between 280 deg and 600 deg K.
journal, March 1966
- Curtis, Henry B.
- Journal of Spacecraft and Rockets, Vol. 3, Issue 3
A Comparison of Infrared-Emittance Measurements and Measurement Techniques
journal, January 1969
- Millard, John P.; Streed, Elmer R.
- Applied Optics, Vol. 8, Issue 7
Calorimetric emissivities for solar-selective coatings on flat sheet
journal, September 1979
- Smith, G. B.; Willrath, H.
- Journal of Physics E: Scientific Instruments, Vol. 12, Issue 9
High-temperature, normal spectral emittance of silicon carbide based materials
journal, July 1994
- Postlethwait, Michael A.; Sikka, Kamal K.; Modest, Michael F.
- Journal of Thermophysics and Heat Transfer, Vol. 8, Issue 3
Ueber das Gesetz der Energieverteilung im Normalspectrum
journal, January 1901
- Planck, Max
- Annalen der Physik, Vol. 309, Issue 3
A method for the simultaneous measurement of total hemispherical emissivity and specific heat of metals by the transient calorimetric technique
journal, March 1991
- Masuda, H.; Sasaki, S.; Higano, M.
- Experimental Thermal and Fluid Science, Vol. 4, Issue 2
Off-Specular Peaks in the Directional Distribution of Reflected Thermal Radiation
journal, May 1966
- Torrance, K. E.; Sparrow, E. M.
- Journal of Heat Transfer, Vol. 88, Issue 2
Emissivity reference paints for high temperature applications
journal, August 2008
- Brandt, Ruediger; Bird, Colin; Neuer, Guenther
- Measurement, Vol. 41, Issue 7
Application of hemispherical surface pyrometers to the measurement of the emissivity of platinum (a low-emissivity material)
journal, April 1966
- Goard, P. R. C.
- Journal of Scientific Instruments, Vol. 43, Issue 4
Method and apparatus for determination of the total directional emissivity of opaque materials in the temperature range 300 to 600 K
journal, January 1994
- Cheng, S. X.; Jing, S. X.; Ge, X. S.
- International Journal of Thermophysics, Vol. 15, Issue 1
Thermal radiation from metal surfaces
journal, January 1978
- Sievers, A. J.
- Journal of the Optical Society of America, Vol. 68, Issue 11
Emittance Measurements on Infrared Windows Exhibiting Wavelength Dependent Diffuse Transmittance
journal, January 1962
- Hatch, S. E.
- Applied Optics, Vol. 1, Issue 5
Far Infrared Reflectometer for Imperfectly Diffuse Specimens
journal, January 1965
- Neher, R. T.; Edwards, D. K.
- Applied Optics, Vol. 4, Issue 7
Thermal emissivity of copper
journal, January 1981
- Window, B.; Harding, G.
- Journal of the Optical Society of America, Vol. 71, Issue 3
Ableitung des Stefan'schen Gesetzes, betreffend die Abhängigkeit der Wärmestrahlung von der Temperatur aus der electromagnetischen Lichttheorie
journal, January 1884
- Boltzmann, Ludwig
- Annalen der Physik, Vol. 258, Issue 6
System for the Measurement of Spectral Emittance at High Temperature
journal, September 1976
- Hylton, James O.; Reid, Robert L.
- AIAA Journal, Vol. 14, Issue 9
Absolute methods in reflectometry
journal, July 1928
- McNicholas, H. J.
- Bureau of Standards Journal of Research, Vol. 1, Issue 1
High-temperature emissivities of copper, aluminum, and silver
journal, January 1977
- Ramanathan, K. G.; Yen, S. H.
- Journal of the Optical Society of America, Vol. 67, Issue 1
Measurement and use of bi-directional reflectance
journal, April 1996
- Zaworski, Joseph R.; Welty, James R.; Drost, M. Kevin
- International Journal of Heat and Mass Transfer, Vol. 39, Issue 6
Measurement of emissivity of partially transparent materials at high temperatures by high-speed spectrometry method
journal, October 1977
- Dvurechenskii, A. V.; Petrov, V. A.; Reznik, V. Yu.
- Measurement Techniques, Vol. 20, Issue 10
Measurement of Absolute Spectral Reflectivity from 10 to 15 Microns
journal, January 1954
- Gier, Joseph T.; Dunkle, Robert V.; Bevans, Jerry T.
- Journal of the Optical Society of America, Vol. 44, Issue 7