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This content will become publicly available on December 17, 2016

Title: Hard x-ray spectroscopy and imaging by a reflection zone plate in the presence of astigmatism

Here, the feasibility of an off-axis x-ray reflection zone plate to perform wavelength-dispersive spectroscopy, on-axis point focusing, and two-dimensional imaging is demonstrated by means of one and the same diffractive optical element (DOE) at a synchrotron radiation facility. The resolving power varies between 3 × 101 and 4 × 102 in the range of 7.6 keV to 9.0 keV, with its maximum at the design energy of 8.3 keV. This result is verified using an adjustable entrance slit, by which horizontal (H) and vertical (V) focusing to 0.85 μm(H) and 1.29 μm(V) is obtained near the sagittal focal plane of the astigmatic configuration. An angular and axial scan proves an accessible field of view of at least 0.6 arcmin × 0.8 arcmin and a focal depth of ±0.86 mm. Supported by the grating efficiency of around 17.5% and a very short pulse elongation, future precision x-ray fluorescence and absorption studies of transition metals at their K-edge on an ultrashort timescale could benefit from our findings.
Authors:
 [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [2] ;  [3] ;  [3] ;  [3] ;  [1]
  1. Helmholtz-Zentrum Berlin fur Materialien und Energie, Berlin (Germany)
  2. Paul Scherrer Inst. (PSI), Villigen (Switzerland)
  3. Argonne National Lab. (ANL), Lemont, IL (United States)
Publication Date:
OSTI Identifier:
1254270
Grant/Contract Number:
AC02-06CH11357
Type:
Accepted Manuscript
Journal Name:
Optics Letters
Additional Journal Information:
Journal Volume: 41; Journal Issue: 1; Journal ID: ISSN 0146-9592
Publisher:
Optical Society of America (OSA)
Research Org:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org:
German Federal Ministry of Education and Research (BMBF); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY diffractive lenses; gratings; spectroscopy x-ray; X-ray imaging