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Title: Pion contamination in the MICE muon beam

Here, the international Muon Ionization Cooling Experiment (MICE) will perform a systematic investigation of ionization cooling with muon beams of momentum between 140 and 240\,MeV/c at the Rutherford Appleton Laboratory ISIS facility. The measurement of ionization cooling in MICE relies on the selection of a pure sample of muons that traverse the experiment. To make this selection, the MICE Muon Beam is designed to deliver a beam of muons with less than $$\sim$$1% contamination. To make the final muon selection, MICE employs a particle-identification (PID) system upstream and downstream of the cooling cell. The PID system includes time-of-flight hodoscopes, threshold-Cherenkov counters and calorimetry. The upper limit for the pion contamination measured in this paper is $$f_\pi < 1.4\%$$ at 90% C.L., including systematic uncertainties. Therefore, the MICE Muon Beam is able to meet the stringent pion-contamination requirements of the study of ionization cooling.
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Publication Date:
OSTI Identifier:
1253008
Report Number(s):
RAL-P-2015-009; FERMILAB-PUB--16-011-APC; arXiv:1511.00556
Journal ID: ISSN 1748-0221; 1402358
Grant/Contract Number:
AC02-07CH11359
Type:
Accepted Manuscript
Journal Name:
Journal of Instrumentation
Additional Journal Information:
Journal Volume: 11; Journal Issue: 03; Journal ID: ISSN 1748-0221
Publisher:
Institute of Physics (IOP)
Research Org:
Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Org:
USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)
Contributing Orgs:
MICE Collaboration
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS instrumentation for particle accelerators and storage rings; low energy (linear accelerators, cyclotrons, electrostatic accelerators); beam-line instrumentation (beam position and profile monitors; beam-intensity monitors; bunch length monitors)