Observing gas-catalyst dynamics at atomic resolution and single-atom sensitivity
Abstract
Transmission electron microscopy (TEM) has become an indispensable technique for studying heterogeneous catalysts. Specifically, advancements of aberration-corrected electron optics and data acquisition schemes have made TEM capable of delivering images of catalysts with sub-Ångström resolution and single-atom sensitivity. Parallel developments of differentially pumped electron microscopes and of gas cells enable in situ observations of catalysts during the exposure to reactive gas environments at pressures of up to atmospheric levels and temperatures of up to several hundred centigrade. Here, we outline how to take advantage of the emerging state-of-the-art instrumentation and methodologies to study surface structures and dynamics to improve the understanding of structure-sensitive catalytic functionality. The idea of using low electron dose-rates in TEM in conjunction with in-line holography and aberration-correction at low voltage (80kV) is introduced to allow maintaining atomic resolution and sensitivity during in situ observations of catalysts. Benefits are demonstrated by exit wave reconstructions of TEM images of a nanocrystalline Co3O4catalyst material acquired in situ during their exposure to either a reducing or oxidizing gas environment.
- Authors:
-
- Haldor Topsøe A/S, Lyngby (Denmark)
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- FEI Company, Eindhoven (Netherlands)
- Univ. of California, Berkeley, CA (United States)
- Publication Date:
- Research Org.:
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1511422
- Alternate Identifier(s):
- OSTI ID: 1250594
- Grant/Contract Number:
- AC02-05CH11231
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Micron
- Additional Journal Information:
- Journal Volume: 68; Journal Issue: C; Journal ID: ISSN 0968-4328
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; Transmission electron microscopy; Exit wave reconstruction; In situ studies; Catalysis; Water-splitting; Nanocrystals; Gas-surface interactions; Dynamics
Citation Formats
Helveg, S., Kisielowski, C. F., Jinschek, J. R., Specht, P., Yuan, G., and Frei, H. Observing gas-catalyst dynamics at atomic resolution and single-atom sensitivity. United States: N. p., 2014.
Web. doi:10.1016/j.micron.2014.07.009.
Helveg, S., Kisielowski, C. F., Jinschek, J. R., Specht, P., Yuan, G., & Frei, H. Observing gas-catalyst dynamics at atomic resolution and single-atom sensitivity. United States. https://doi.org/10.1016/j.micron.2014.07.009
Helveg, S., Kisielowski, C. F., Jinschek, J. R., Specht, P., Yuan, G., and Frei, H. Sat .
"Observing gas-catalyst dynamics at atomic resolution and single-atom sensitivity". United States. https://doi.org/10.1016/j.micron.2014.07.009. https://www.osti.gov/servlets/purl/1511422.
@article{osti_1511422,
title = {Observing gas-catalyst dynamics at atomic resolution and single-atom sensitivity},
author = {Helveg, S. and Kisielowski, C. F. and Jinschek, J. R. and Specht, P. and Yuan, G. and Frei, H.},
abstractNote = {Transmission electron microscopy (TEM) has become an indispensable technique for studying heterogeneous catalysts. Specifically, advancements of aberration-corrected electron optics and data acquisition schemes have made TEM capable of delivering images of catalysts with sub-Ångström resolution and single-atom sensitivity. Parallel developments of differentially pumped electron microscopes and of gas cells enable in situ observations of catalysts during the exposure to reactive gas environments at pressures of up to atmospheric levels and temperatures of up to several hundred centigrade. Here, we outline how to take advantage of the emerging state-of-the-art instrumentation and methodologies to study surface structures and dynamics to improve the understanding of structure-sensitive catalytic functionality. The idea of using low electron dose-rates in TEM in conjunction with in-line holography and aberration-correction at low voltage (80kV) is introduced to allow maintaining atomic resolution and sensitivity during in situ observations of catalysts. Benefits are demonstrated by exit wave reconstructions of TEM images of a nanocrystalline Co3O4catalyst material acquired in situ during their exposure to either a reducing or oxidizing gas environment.},
doi = {10.1016/j.micron.2014.07.009},
journal = {Micron},
number = C,
volume = 68,
place = {United States},
year = {Sat Aug 23 00:00:00 EDT 2014},
month = {Sat Aug 23 00:00:00 EDT 2014}
}
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