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This content will become publicly available on April 27, 2017

Title: Accurate determination of the valence band edge in hard x-ray photoemission spectra using GW theory

Authors:
 [1] ;  [2] ;  [3] ;  [4] ;  [3] ;  [5] ;  [4] ;  [6] ;  [3]
  1. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA, Department of Physics and Department of Materials and the Thomas Young Centre for Theory and Simulation of Materials, Imperial College London, London SW7 2AZ, United Kingdom
  2. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA, Department of Physics, University of California, Davis, California 95616, USA, Peter-Gruenberg-Institut-6, Forschungszentrum Juelich, Juelich, Germany
  3. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA, Department of Physics, University of California, Davis, California 95616, USA
  4. Deutsches Elektronen-Synchrotron DESY, Photon Science, Notkestraße 85, D-22607 Hamburg, Germany
  5. Peter-Gruenberg-Institut-6, Forschungszentrum Juelich, Juelich, Germany
  6. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA, Department of Physics, University of California, Berkeley, California 94720, USA
Publication Date:
OSTI Identifier:
1249893
Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 119; Journal Issue: 16; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English