Correlations between In Situ Conductivity and Uniform-Height Epitaxial Morphology in
Abstract
The growth of Pb on Si(111)-7x7 at temperatures from 72 K to 201 K has been investigated using in situ electrical resistivity measurements and Scanning Tunneling Microscopy (STM). For temperatures T>140 K the specific resistivity ρ(θ) vs coverage θ shows an unusual "hump", instead of the expected monotonic decrease with θ. This novel result correlates well with the formation of uniform height 8-layer Pb islands and the superdiffusive motion of the wetting layer, despite the low temperatures. A model of the film resistivity as two resistors in series, the amorphous wetting layer and the crystalline islands, explains quantitatively the resistivity dependence on θ.
- Authors:
-
- Maria Curie-Sklodowska Univ., Lublin (Poland)
- Ames Lab. and Iowa State Univ., Ames, IA (United States)
- Publication Date:
- Research Org.:
- Ames Laboratory (AMES), Ames, IA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1249345
- Alternate Identifier(s):
- OSTI ID: 1238822
- Report Number(s):
- IS-J-8964
Journal ID: ISSN 0031-9007; PRLTAO
- Grant/Contract Number:
- AC0207CH11358; 2014/13/B/ST5/04442
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Physical Review Letters
- Additional Journal Information:
- Journal Volume: 116; Journal Issue: 8; Journal ID: ISSN 0031-9007
- Publisher:
- American Physical Society (APS)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Jałochowski, M., Zdyb, R., and Tringides, M. C. Correlations between In Situ Conductivity and Uniform-Height Epitaxial Morphology in Pb/Si(111)₋(7×7). United States: N. p., 2016.
Web. doi:10.1103/PhysRevLett.116.086101.
Jałochowski, M., Zdyb, R., & Tringides, M. C. Correlations between In Situ Conductivity and Uniform-Height Epitaxial Morphology in Pb/Si(111)₋(7×7). United States. https://doi.org/10.1103/PhysRevLett.116.086101
Jałochowski, M., Zdyb, R., and Tringides, M. C. Tue .
"Correlations between In Situ Conductivity and Uniform-Height Epitaxial Morphology in Pb/Si(111)₋(7×7)". United States. https://doi.org/10.1103/PhysRevLett.116.086101. https://www.osti.gov/servlets/purl/1249345.
@article{osti_1249345,
title = {Correlations between In Situ Conductivity and Uniform-Height Epitaxial Morphology in Pb/Si(111)₋(7×7)},
author = {Jałochowski, M. and Zdyb, R. and Tringides, M. C.},
abstractNote = {The growth of Pb on Si(111)-7x7 at temperatures from 72 K to 201 K has been investigated using in situ electrical resistivity measurements and Scanning Tunneling Microscopy (STM). For temperatures T>140 K the specific resistivity ρ(θ) vs coverage θ shows an unusual "hump", instead of the expected monotonic decrease with θ. This novel result correlates well with the formation of uniform height 8-layer Pb islands and the superdiffusive motion of the wetting layer, despite the low temperatures. A model of the film resistivity as two resistors in series, the amorphous wetting layer and the crystalline islands, explains quantitatively the resistivity dependence on θ.},
doi = {10.1103/PhysRevLett.116.086101},
journal = {Physical Review Letters},
number = 8,
volume = 116,
place = {United States},
year = {Tue Feb 23 00:00:00 EST 2016},
month = {Tue Feb 23 00:00:00 EST 2016}
}
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