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This content will become publicly available on March 22, 2017

Title: Single-crystal sapphire microstructure for high-resolution synchrotron X-ray monochromators

We report on the growth and characterization of several sapphire single crystals for the purpose of x-ray optics applications. Structural defects were studied by means of laboratory double-crystal X-ray diffractometry and white beam synchrotron-radiation topography. The investigations confirmed that the main defect types are dislocations. The best quality crystal was grown using the Kyropoulos technique with a dislocation density of 102-103 cm-2 and a small area with approximately 2*2 mm2 did not show dislocation contrast in many reflections and has suitable quality for application as a backscattering monochromator. As a result, a clear correlation between growth rate and dislocation density is observed, though growth rate is not the only parameter impacting the quality.
Authors:
 [1] ;  [2] ;  [2] ;  [2] ;  [2] ;  [3] ;  [2] ;  [2] ;  [2] ;  [4] ;  [5] ;  [6] ;  [6] ;  [7] ;  [8] ;  [9] ;  [9] ;  [10]
  1. Shubnikov Institute for Crystallography RAS, Moscow (Russia); Lomonosov Moscow State Univ., Moscow (Russia)
  2. Shubnikov Institute for Crystallography RAS, Moscow (Russia)
  3. Institute for Crystallography RAS, Kaluga (Russia)
  4. Julich Center for Neutron Science (JCNS) and Peter Grunberg Institute PGI, Julich (Germany); Univ. of Liege, Liege (Belgium); European Synchrotron Radiation Facility, Grenoble (France)
  5. Julich Center for Neutron Science (JCNS) and Peter Grunberg Institute PGI, Julich (Germany); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  6. Karlsruhe Institute of Technology, Institute for Photon Science and Synchrotron Radiation and ANKA Synchrotron Radiation Facility, Eggenstein-Leopoldshafen (Germany)
  7. European Synchrotron Radiation Facility, Grenoble (France)
  8. Univ. of Freiburg, Freiburg (Germany)
  9. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  10. Julich Center for Neutron Science (JCNS) and Peter Grunberg Institute PGI, Julich (Germany); Univ. of Liege, Liege (Belgium); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Publication Date:
OSTI Identifier:
1247945
Grant/Contract Number:
AC05-00OR22725
Type:
Accepted Manuscript
Journal Name:
Crystal Research and Technology
Additional Journal Information:
Journal Volume: 51; Journal Issue: 4; Journal ID: ISSN 0232-1300
Publisher:
Wiley
Research Org:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Org:
USDOE Office of Science (SC)
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY x-ray optics; topography; sapphire; dislocations