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This content will become publicly available on February 11, 2017

Title: An application of a zero-inflated lifetime distribution with multiple and incomplete data sources

In this study, we analyze data sampled from a population of parts in which an associated anomaly can occur at assembly or after assembly. Using a zero-inflated lifetime distribution to fit left-censored and right-censored data as well data from a supplementary sample, we make predictions about the proportion of the population with anomalies today and in the future. Goodness-of-fit is also addressed.
Authors:
 [1] ;  [1]
  1. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Publication Date:
OSTI Identifier:
1247679
Report Number(s):
LA-UR--15-29671
Journal ID: ISSN 0748-8017
Grant/Contract Number:
AC52-06NA25396
Type:
Accepted Manuscript
Journal Name:
Quality and Reliability Engineering International
Additional Journal Information:
Journal Name: Quality and Reliability Engineering International; Journal ID: ISSN 0748-8017
Publisher:
Wiley
Research Org:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
97 MATHEMATICS AND COMPUTING Bayesian inference; binomial and exponential distribution; goodness-of-fit; left-censored and right-censored data; prediction