The effect of humidity on reverse breakdown in 3D silicon sensors
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1247226
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Additional Journal Information:
- Journal Name: Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment Journal Volume: 785 Journal Issue: C; Journal ID: ISSN 0168-9002
- Publisher:
- Elsevier
- Country of Publication:
- Netherlands
- Language:
- English
Citation Formats
McDuff, H., Hoeferkamp, M. R., Seidel, S., Wang, R., Kenney, C. J., Hasi, J., and Parker, S. I. The effect of humidity on reverse breakdown in 3D silicon sensors. Netherlands: N. p., 2015.
Web. doi:10.1016/j.nima.2015.02.056.
McDuff, H., Hoeferkamp, M. R., Seidel, S., Wang, R., Kenney, C. J., Hasi, J., & Parker, S. I. The effect of humidity on reverse breakdown in 3D silicon sensors. Netherlands. https://doi.org/10.1016/j.nima.2015.02.056
McDuff, H., Hoeferkamp, M. R., Seidel, S., Wang, R., Kenney, C. J., Hasi, J., and Parker, S. I. Mon .
"The effect of humidity on reverse breakdown in 3D silicon sensors". Netherlands. https://doi.org/10.1016/j.nima.2015.02.056.
@article{osti_1247226,
title = {The effect of humidity on reverse breakdown in 3D silicon sensors},
author = {McDuff, H. and Hoeferkamp, M. R. and Seidel, S. and Wang, R. and Kenney, C. J. and Hasi, J. and Parker, S. I.},
abstractNote = {},
doi = {10.1016/j.nima.2015.02.056},
journal = {Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment},
number = C,
volume = 785,
place = {Netherlands},
year = {Mon Jun 01 00:00:00 EDT 2015},
month = {Mon Jun 01 00:00:00 EDT 2015}
}
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1016/j.nima.2015.02.056
https://doi.org/10.1016/j.nima.2015.02.056
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Cited by: 4 works
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