STEM-EDX tomography of bimetallic nanoparticles: A methodological investigation
Abstract
This paper presents an investigation of the limitations and optimization of energy dispersive X-ray (EDX) tomography within the scanning transmission electron microscope, focussing on application of the technique to characterising the 3D elemental distribution of bimetallic AgAu nanoparticles. The detector collection efficiency when using a standard tomography holder is characterised using a tomographic data set from a single nanoparticle and compared to a standard low background double tilt holder. Optical depth profiling is used to investigate the angles and origin of detector shadowing as a function of specimen field of view. A novel time-varied acquisition scheme is described to compensate for variations in the intensity of spectrum images at each sample tilt. Lastly, the ability of EDX spectrum images to satisfy the projection requirement for nanoparticle samples is discussed, with consideration of the effect of absorption and shadowing variations
- Authors:
- Publication Date:
- Research Org.:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1254513
- Alternate Identifier(s):
- OSTI ID: 1245467
- Grant/Contract Number:
- AC02-06CH11357
- Resource Type:
- Published Article
- Journal Name:
- Ultramicroscopy
- Additional Journal Information:
- Journal Name: Ultramicroscopy Journal Volume: 162 Journal Issue: C; Journal ID: ISSN 0304-3991
- Publisher:
- Elsevier
- Country of Publication:
- Netherlands
- Language:
- English
- Subject:
- 77 NANOSCIENCE AND NANOTECHNOLOGY; bimetallic nanoparticles; electron tomography; energy dispersive x-ray spectroscopy
Citation Formats
Slater, Thomas J. A., Janssen, Arne, Camargo, Pedro H. C., Burke, M. Grace, Zaluzec, Nestor J., and Haigh, Sarah J. STEM-EDX tomography of bimetallic nanoparticles: A methodological investigation. Netherlands: N. p., 2016.
Web. doi:10.1016/j.ultramic.2015.10.007.
Slater, Thomas J. A., Janssen, Arne, Camargo, Pedro H. C., Burke, M. Grace, Zaluzec, Nestor J., & Haigh, Sarah J. STEM-EDX tomography of bimetallic nanoparticles: A methodological investigation. Netherlands. https://doi.org/10.1016/j.ultramic.2015.10.007
Slater, Thomas J. A., Janssen, Arne, Camargo, Pedro H. C., Burke, M. Grace, Zaluzec, Nestor J., and Haigh, Sarah J. Tue .
"STEM-EDX tomography of bimetallic nanoparticles: A methodological investigation". Netherlands. https://doi.org/10.1016/j.ultramic.2015.10.007.
@article{osti_1254513,
title = {STEM-EDX tomography of bimetallic nanoparticles: A methodological investigation},
author = {Slater, Thomas J. A. and Janssen, Arne and Camargo, Pedro H. C. and Burke, M. Grace and Zaluzec, Nestor J. and Haigh, Sarah J.},
abstractNote = {This paper presents an investigation of the limitations and optimization of energy dispersive X-ray (EDX) tomography within the scanning transmission electron microscope, focussing on application of the technique to characterising the 3D elemental distribution of bimetallic AgAu nanoparticles. The detector collection efficiency when using a standard tomography holder is characterised using a tomographic data set from a single nanoparticle and compared to a standard low background double tilt holder. Optical depth profiling is used to investigate the angles and origin of detector shadowing as a function of specimen field of view. A novel time-varied acquisition scheme is described to compensate for variations in the intensity of spectrum images at each sample tilt. Lastly, the ability of EDX spectrum images to satisfy the projection requirement for nanoparticle samples is discussed, with consideration of the effect of absorption and shadowing variations},
doi = {10.1016/j.ultramic.2015.10.007},
journal = {Ultramicroscopy},
number = C,
volume = 162,
place = {Netherlands},
year = {Tue Mar 01 00:00:00 EST 2016},
month = {Tue Mar 01 00:00:00 EST 2016}
}
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https://doi.org/10.1016/j.ultramic.2015.10.007
https://doi.org/10.1016/j.ultramic.2015.10.007
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