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Title: Origin of thickness dependence of structural phase transition temperatures in highly strained BiFeO3 thin films

Authors:
 [1] ;  [2] ;  [2] ;  [3] ;  [1] ;  [1] ;  [4]
  1. Department of Physics, University of Michigan, Ann Arbor, Michigan 48109, USA
  2. Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
  3. X-Ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA
  4. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
Publication Date:
OSTI Identifier:
1244129
Grant/Contract Number:
AC02-06CH11357; FG02-06ER46273
Type:
Published Article
Journal Name:
APL Materials
Additional Journal Information:
Journal Volume: 4; Journal Issue: 3; Journal ID: ISSN 2166-532X
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English