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This content will become publicly available on March 9, 2017

Title: In-situ synchrotron micro-diffraction study of surface, interface, grain structure, and strain/stress evolution during Sn whisker/hillock formation

Authors:
 [1] ;  [2] ;  [3] ;  [1] ;  [1] ;  [4] ;  [4] ;  [5] ;  [4]
  1. School of Engineering, Brown University, Providence, Rhode Island 02912, USA
  2. IBM, Hopewell Junction, New York 12533, USA
  3. Saint-Gobain, Northboro R&D Center, Northborough, Massachusetts 01532, USA
  4. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA
  5. Oak Ridge National Lab, Oak Ridge, Tennessee 37831, USA
Publication Date:
OSTI Identifier:
1241406
Grant/Contract Number:
AC02-06CH11357
Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 119; Journal Issue: 10; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English