DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Determination of recombination radius in Si for binary collision approximation codes

Abstract

Displacement damage caused by ions or neutrons in microelectronic devices can have significant effect on the performance of these devices. Therefore, it is important to predict not only the displacement damage profile, but also its magnitude precisely. Analytical methods and binary collision approximation codes working with amorphous targets use the concept of displacement energy, the energy that a lattice atom has to receive to create a permanent replacement. It was found that this “displacement energy” is direction dependent; it can range from 12 to 32 eV in silicon. Obviously, this model fails in BCA codes that work with crystalline targets, such as Marlowe. Marlowe does not use displacement energy; instead, it uses lattice binding energy only and then pairs the interstitial atoms with vacancies. Then based on the configuration of the Frenkel pairs it classifies them as close, near, or distant pairs, and considers the distant pairs the permanent replacements. Unfortunately, this separation is an ad hoc assumption, and the results do not agree with molecular dynamics calculations. After irradiation, there is a prompt recombination of interstitials and vacancies if they are nearby, within a recombination radius. In order to implement this recombination radius in Marlowe, we used the comparisonmore » of MD and Marlowe calculation in a range of ion energies in single crystal silicon target. As a result, the calculations showed that a single recombination radius of ~7.4 Å in Marlowe for a range of ion energies gives an excellent agreement with MD.« less

Authors:
 [1];  [1]
  1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1237661
Report Number(s):
SAND-2015-5277J
Journal ID: ISSN 0168-583X; PII: S0168583X15008241
Grant/Contract Number:  
AC04-94AL85000
Resource Type:
Accepted Manuscript
Journal Name:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Additional Journal Information:
Journal Volume: 5; Journal Issue: 1; Journal ID: ISSN 0168-583X
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; binary collision approximation; molecular dynamics; recombination radius; displacement threshold energy

Citation Formats

Vizkelethy, Gyorgy, and Foiles, Stephen M. Determination of recombination radius in Si for binary collision approximation codes. United States: N. p., 2015. Web. doi:10.1016/j.nimb.2015.08.088.
Vizkelethy, Gyorgy, & Foiles, Stephen M. Determination of recombination radius in Si for binary collision approximation codes. United States. https://doi.org/10.1016/j.nimb.2015.08.088
Vizkelethy, Gyorgy, and Foiles, Stephen M. Fri . "Determination of recombination radius in Si for binary collision approximation codes". United States. https://doi.org/10.1016/j.nimb.2015.08.088. https://www.osti.gov/servlets/purl/1237661.
@article{osti_1237661,
title = {Determination of recombination radius in Si for binary collision approximation codes},
author = {Vizkelethy, Gyorgy and Foiles, Stephen M.},
abstractNote = {Displacement damage caused by ions or neutrons in microelectronic devices can have significant effect on the performance of these devices. Therefore, it is important to predict not only the displacement damage profile, but also its magnitude precisely. Analytical methods and binary collision approximation codes working with amorphous targets use the concept of displacement energy, the energy that a lattice atom has to receive to create a permanent replacement. It was found that this “displacement energy” is direction dependent; it can range from 12 to 32 eV in silicon. Obviously, this model fails in BCA codes that work with crystalline targets, such as Marlowe. Marlowe does not use displacement energy; instead, it uses lattice binding energy only and then pairs the interstitial atoms with vacancies. Then based on the configuration of the Frenkel pairs it classifies them as close, near, or distant pairs, and considers the distant pairs the permanent replacements. Unfortunately, this separation is an ad hoc assumption, and the results do not agree with molecular dynamics calculations. After irradiation, there is a prompt recombination of interstitials and vacancies if they are nearby, within a recombination radius. In order to implement this recombination radius in Marlowe, we used the comparison of MD and Marlowe calculation in a range of ion energies in single crystal silicon target. As a result, the calculations showed that a single recombination radius of ~7.4 Å in Marlowe for a range of ion energies gives an excellent agreement with MD.},
doi = {10.1016/j.nimb.2015.08.088},
journal = {Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms},
number = 1,
volume = 5,
place = {United States},
year = {Fri Sep 11 00:00:00 EDT 2015},
month = {Fri Sep 11 00:00:00 EDT 2015}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Citation Metrics:
Cited by: 4 works
Citation information provided by
Web of Science

Save / Share:

Works referenced in this record:

Model of defect reactions and the influence of clustering in pulse-neutron-irradiated Si
journal, August 2008

  • Myers, S. M.; Cooper, P. J.; Wampler, W. R.
  • Journal of Applied Physics, Vol. 104, Issue 4
  • DOI: 10.1063/1.2963697

The Displacement of Atoms in Solids by Radiation
journal, January 1955


Molecular dynamics simulations of bulk displacement threshold energies in Si
journal, June 1994

  • Miller, Leann A.; Brice, David K.; Prinja, Anil K.
  • Radiation Effects and Defects in Solids, Vol. 129, Issue 1-2
  • DOI: 10.1080/10420159408228889

Computer simulation of atomic-displacement cascades in solids in the binary-collision approximation
journal, June 1974


Linear collision sequences in fcc and L12 metals: A computer simulation study
journal, January 2002

  • Hou, M.
  • Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 187, Issue 1
  • DOI: 10.1016/S0168-583X(01)00846-1

Binding energy effects in cascade evolution and sputtering
journal, July 1996

  • Robinson, Mark T.
  • Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 115, Issue 1-4
  • DOI: 10.1016/0168-583X(95)01567-1

Computer studies of the reflection of light ions from solids
journal, January 1976


Energy Dissipation by Ions in the kev Region
journal, October 1961


Fast Parallel Algorithms for Short-Range Molecular Dynamics
journal, March 1995


Empirical interatomic potential for silicon with improved elastic properties
journal, November 1988


The temporal development of collision cascades in the binary-collision approximation
journal, March 1990

  • Robinson, Mark T.
  • Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 48, Issue 1-4
  • DOI: 10.1016/0168-583X(90)90150-S

Works referencing / citing this record:

Study of Defects Produced by Displacement Cascades in Tantalum Monocarbide
journal, March 2018

  • Djaafri, Abdelkader; Kadoun, Abd-Ed-Daïm; Driss-Khodja, Mohammed
  • Arabian Journal for Science and Engineering, Vol. 43, Issue 7
  • DOI: 10.1007/s13369-018-3127-0