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This content will become publicly available on January 5, 2017

Title: In situ surface/interface x-ray diffractometer for oxide molecular beam epitaxy

Authors:
 [1] ;  [2] ;  [3] ;  [3] ;  [3] ;  [1] ;  [1]
  1. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA
  2. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA, Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA
  3. Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
Publication Date:
OSTI Identifier:
1234176
Grant/Contract Number:
AC02-06CH11357
Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 87; Journal Issue: 1; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English