In-operando synchronous time-multiplexed O K-edge x-ray absorption spectromicroscopy of functioning tantalum oxide memristors
- Authors:
-
[2];
- Hewlett-Packard Laboratories, 1501 Page Mill Road, Palo Alto, California 94304, USA, Department of Electrical Engineering, Stanford University, Stanford, California 94305, USA
- Hewlett-Packard Laboratories, 1501 Page Mill Road, Palo Alto, California 94304, USA
- Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
- Department of Electrical Engineering, Stanford University, Stanford, California 94305, USA
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1228673
- Grant/Contract Number:
- AC02-05CH11231
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Journal of Applied Physics
- Additional Journal Information:
- Journal Name: Journal of Applied Physics Journal Volume: 118 Journal Issue: 3; Journal ID: ISSN 0021-8979
- Publisher:
- American Institute of Physics
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Kumar, Suhas, Graves, Catherine E., Strachan, John Paul, Kilcoyne, A. L. David, Tyliszczak, Tolek, Nishi, Yoshio, and Williams, R. Stanley. In-operando synchronous time-multiplexed O K-edge x-ray absorption spectromicroscopy of functioning tantalum oxide memristors. United States: N. p., 2015.
Web. doi:10.1063/1.4926477.
Kumar, Suhas, Graves, Catherine E., Strachan, John Paul, Kilcoyne, A. L. David, Tyliszczak, Tolek, Nishi, Yoshio, & Williams, R. Stanley. In-operando synchronous time-multiplexed O K-edge x-ray absorption spectromicroscopy of functioning tantalum oxide memristors. United States. https://doi.org/10.1063/1.4926477
Kumar, Suhas, Graves, Catherine E., Strachan, John Paul, Kilcoyne, A. L. David, Tyliszczak, Tolek, Nishi, Yoshio, and Williams, R. Stanley. Wed .
"In-operando synchronous time-multiplexed O K-edge x-ray absorption spectromicroscopy of functioning tantalum oxide memristors". United States. https://doi.org/10.1063/1.4926477.
@article{osti_1228673,
title = {In-operando synchronous time-multiplexed O K-edge x-ray absorption spectromicroscopy of functioning tantalum oxide memristors},
author = {Kumar, Suhas and Graves, Catherine E. and Strachan, John Paul and Kilcoyne, A. L. David and Tyliszczak, Tolek and Nishi, Yoshio and Williams, R. Stanley},
abstractNote = {},
doi = {10.1063/1.4926477},
journal = {Journal of Applied Physics},
number = 3,
volume = 118,
place = {United States},
year = {Wed Jul 15 00:00:00 EDT 2015},
month = {Wed Jul 15 00:00:00 EDT 2015}
}
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https://doi.org/10.1063/1.4926477
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Cited by: 22 works
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