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Title: Characterization of the temperature dependence of the thermoreflectance coefficient for conductive thin films

Authors:
 [1] ;  [2] ;  [1]
  1. Baskin School of Engineering, University of California, Santa Cruz, California 95064, USA, Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana 47907, USA
  2. Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana 47907, USA
Publication Date:
OSTI Identifier:
1228545
Grant/Contract Number:
SC0001009
Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 86; Journal Issue: 2; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English