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Title: High-resolution single-shot spectral monitoring of hard x-ray free-electron laser radiation

Abstract

We have developed an on-line spectrometer for hard x-ray free-electron laser (XFEL) radiation based on a nanostructured diamond diffraction grating and a bent crystal analyzer. Our method provides high spectral resolution, interferes negligibly with the XFEL beam, and can withstand the intense hard x-ray pulses at high repetition rates of >100 Hz. The spectrometer is capable of providing shot-to-shot spectral information for the normalization of data obtained in scientific experiments and optimization of the accelerator operation parameters. We have demonstrated these capabilities of the setup at the Linac Coherent Light Source, in self-amplified spontaneous emission mode at full energy of >1 mJ with a 120 Hz repetition rate, obtaining a resolving power of Ε/δΕ > 3 × 104. In conclusion, the device was also used to monitor the effects of pulse duration down to 8 fs by analysis of the spectral spike width.

Authors:
 [1];  [1];  [2];  [1];  [3];  [1];  [1];  [2];  [1];  [2];  [1];  [2];  [2];  [2];  [1]
  1. Paul Scherrer Inst. (PSI), Villigen (Switzerland)
  2. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  3. European XFEL GmbH, Hamburg (Germany)
Publication Date:
Research Org.:
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1228043
Grant/Contract Number:  
AC02-76SF00515
Resource Type:
Accepted Manuscript
Journal Name:
Optica
Additional Journal Information:
Journal Volume: 2; Journal Issue: 10; Journal ID: ISSN 2334-2536
Publisher:
Optical Society of America
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats

Makita, M., Karvinen, P., Zhu, D., Juranic, P. N., Grünert, J., Cartier, S., Jungmann-Smith, J. H., Lemke, H. T., Mozzanica, A., Nelson, S., Patthey, L., Sikorski, M., Song, S., Feng, Y., and David, C.. High-resolution single-shot spectral monitoring of hard x-ray free-electron laser radiation. United States: N. p., 2015. Web. doi:10.1364/OPTICA.2.000912.
Makita, M., Karvinen, P., Zhu, D., Juranic, P. N., Grünert, J., Cartier, S., Jungmann-Smith, J. H., Lemke, H. T., Mozzanica, A., Nelson, S., Patthey, L., Sikorski, M., Song, S., Feng, Y., & David, C.. High-resolution single-shot spectral monitoring of hard x-ray free-electron laser radiation. United States. https://doi.org/10.1364/OPTICA.2.000912
Makita, M., Karvinen, P., Zhu, D., Juranic, P. N., Grünert, J., Cartier, S., Jungmann-Smith, J. H., Lemke, H. T., Mozzanica, A., Nelson, S., Patthey, L., Sikorski, M., Song, S., Feng, Y., and David, C.. Fri . "High-resolution single-shot spectral monitoring of hard x-ray free-electron laser radiation". United States. https://doi.org/10.1364/OPTICA.2.000912. https://www.osti.gov/servlets/purl/1228043.
@article{osti_1228043,
title = {High-resolution single-shot spectral monitoring of hard x-ray free-electron laser radiation},
author = {Makita, M. and Karvinen, P. and Zhu, D. and Juranic, P. N. and Grünert, J. and Cartier, S. and Jungmann-Smith, J. H. and Lemke, H. T. and Mozzanica, A. and Nelson, S. and Patthey, L. and Sikorski, M. and Song, S. and Feng, Y. and David, C.},
abstractNote = {We have developed an on-line spectrometer for hard x-ray free-electron laser (XFEL) radiation based on a nanostructured diamond diffraction grating and a bent crystal analyzer. Our method provides high spectral resolution, interferes negligibly with the XFEL beam, and can withstand the intense hard x-ray pulses at high repetition rates of >100 Hz. The spectrometer is capable of providing shot-to-shot spectral information for the normalization of data obtained in scientific experiments and optimization of the accelerator operation parameters. We have demonstrated these capabilities of the setup at the Linac Coherent Light Source, in self-amplified spontaneous emission mode at full energy of >1 mJ with a 120 Hz repetition rate, obtaining a resolving power of Ε/δΕ > 3 × 104. In conclusion, the device was also used to monitor the effects of pulse duration down to 8 fs by analysis of the spectral spike width.},
doi = {10.1364/OPTICA.2.000912},
journal = {Optica},
number = 10,
volume = 2,
place = {United States},
year = {Fri Oct 16 00:00:00 EDT 2015},
month = {Fri Oct 16 00:00:00 EDT 2015}
}

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Works referenced in this record:

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First lasing and operation of an ångstrom-wavelength free-electron laser
journal, August 2010


Design and operation of a hard x-ray transmissive single-shot spectrometer at LCLS
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journal, March 2012


Statistical properties of the radiation from SASE FEL operating in the linear regime
book, January 1998


The soft x-ray instrument for materials studies at the linac coherent light source x-ray free-electron laser
text, January 2012


Works referencing / citing this record:

A beam branching method for timing and spectral characterization of hard X-ray free-electron lasers
journal, January 2016

  • Katayama, Tetsuo; Owada, Shigeki; Togashi, Tadashi
  • Structural Dynamics, Vol. 3, Issue 3
  • DOI: 10.1063/1.4939655

Perspective: Opportunities for ultrafast science at SwissFEL
journal, November 2017

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  • Structural Dynamics, Vol. 4, Issue 6
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On-line monitoring of the spatial properties of hard X-ray free-electron lasers based on a grating splitter
journal, April 2019


Characterizing transmissive diamond gratings as beam splitters for the hard X-ray single-shot spectrometer of the European XFEL
journal, April 2019


Diffraction properties of a strongly bent diamond crystal used as a dispersive spectrometer for XFEL pulses
journal, June 2019

  • Samoylova, Liubov; Boesenberg, Ulrike; Chumakov, Aleksandr
  • Journal of Synchrotron Radiation, Vol. 26, Issue 4
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Short-wavelength free-electron laser sources and science: a review
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SwissFEL: The Swiss X-ray Free Electron Laser
journal, July 2017

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SwissFEL Aramis beamline photon diagnostics
text, January 2018

  • Juranic, Pavle; Rehanek, Jens; Arrell, Christopher A.
  • Deutsches Elektronen-Synchrotron, DESY, Hamburg
  • DOI: 10.3204/pubdb-2019-00091

X-ray photon diagnostics at the European XFEL
text, January 2019

  • Grünert, Jan; Carbonell, Marc Planas; Dietrich, Florian
  • Deutsches Elektronen-Synchrotron, DESY, Hamburg
  • DOI: 10.3204/pubdb-2019-05090

Perspective: Opportunities for ultrafast science at SwissFEL
text, January 2017


Perspective: Opportunities for ultrafast science at SwissFEL
text, January 2017


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journal, October 2017

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