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Title: Effect of current injection into thin-film Josephson junctions

New thin-film Josephson junctions have recently been tested in which the current injected into one of the junction banks governs Josephson phenomena. One thus can continuously manage the phase distribution at the junction by changing the injected current. Our method of calculating the distribution of injected currents is also proposed for a half-infinite thin-film strip with source-sink points at arbitrary positions at the film edges. The strip width W is assumed small relative to Λ=2λ2/d;λ is the bulk London penetration depth of the film material and d is the film thickness.
Authors:
 [1] ;  [2]
  1. Ames Lab., Ames, IA (United States)
  2. Tel Aviv Univ., Ramat Aviv (Israel)
Publication Date:
OSTI Identifier:
1226910
Report Number(s):
IS--J 8548
Journal ID: ISSN 1098-0121; PRBMDO
Grant/Contract Number:
AC02-07CH11358
Type:
Accepted Manuscript
Journal Name:
Physical Review. B, Condensed Matter and Materials Physics
Additional Journal Information:
Journal Volume: 90; Journal Issue: 18; Journal ID: ISSN 1098-0121
Publisher:
American Physical Society (APS)
Research Org:
Ames Laboratory (AMES), Ames, IA (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING