Effect of current injection into thin-film Josephson junctions
Abstract
New thin-film Josephson junctions have recently been tested in which the current injected into one of the junction banks governs Josephson phenomena. One thus can continuously manage the phase distribution at the junction by changing the injected current. Our method of calculating the distribution of injected currents is also proposed for a half-infinite thin-film strip with source-sink points at arbitrary positions at the film edges. The strip width W is assumed small relative to Λ=2λ2/d;λ is the bulk London penetration depth of the film material and d is the film thickness.
- Authors:
-
- Ames Lab., Ames, IA (United States)
- Tel Aviv Univ., Ramat Aviv (Israel)
- Publication Date:
- Research Org.:
- Ames Lab., Ames, IA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1226910
- Alternate Identifier(s):
- OSTI ID: 1180080
- Report Number(s):
- IS-J 8548
Journal ID: ISSN 1098-0121; PRBMDO
- Grant/Contract Number:
- AC02-07CH11358
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Physical Review. B, Condensed Matter and Materials Physics
- Additional Journal Information:
- Journal Volume: 90; Journal Issue: 18; Journal ID: ISSN 1098-0121
- Publisher:
- American Physical Society (APS)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING
Citation Formats
Kogan, V. G., and Mints, R. G.. Effect of current injection into thin-film Josephson junctions. United States: N. p., 2014.
Web. doi:10.1103/PhysRevB.90.184504.
Kogan, V. G., & Mints, R. G.. Effect of current injection into thin-film Josephson junctions. United States. https://doi.org/10.1103/PhysRevB.90.184504
Kogan, V. G., and Mints, R. G.. Tue .
"Effect of current injection into thin-film Josephson junctions". United States. https://doi.org/10.1103/PhysRevB.90.184504. https://www.osti.gov/servlets/purl/1226910.
@article{osti_1226910,
title = {Effect of current injection into thin-film Josephson junctions},
author = {Kogan, V. G. and Mints, R. G.},
abstractNote = {New thin-film Josephson junctions have recently been tested in which the current injected into one of the junction banks governs Josephson phenomena. One thus can continuously manage the phase distribution at the junction by changing the injected current. Our method of calculating the distribution of injected currents is also proposed for a half-infinite thin-film strip with source-sink points at arbitrary positions at the film edges. The strip width W is assumed small relative to Λ=2λ2/d;λ is the bulk London penetration depth of the film material and d is the film thickness.},
doi = {10.1103/PhysRevB.90.184504},
journal = {Physical Review. B, Condensed Matter and Materials Physics},
number = 18,
volume = 90,
place = {United States},
year = {Tue Nov 11 00:00:00 EST 2014},
month = {Tue Nov 11 00:00:00 EST 2014}
}
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Cited by: 3 works
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