DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Effect of current injection into thin-film Josephson junctions

Abstract

New thin-film Josephson junctions have recently been tested in which the current injected into one of the junction banks governs Josephson phenomena. One thus can continuously manage the phase distribution at the junction by changing the injected current. Our method of calculating the distribution of injected currents is also proposed for a half-infinite thin-film strip with source-sink points at arbitrary positions at the film edges. The strip width W is assumed small relative to Λ=2λ2/d;λ is the bulk London penetration depth of the film material and d is the film thickness.

Authors:
 [1];  [2]
  1. Ames Lab., Ames, IA (United States)
  2. Tel Aviv Univ., Ramat Aviv (Israel)
Publication Date:
Research Org.:
Ames Lab., Ames, IA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1226910
Alternate Identifier(s):
OSTI ID: 1180080
Report Number(s):
IS-J 8548
Journal ID: ISSN 1098-0121; PRBMDO
Grant/Contract Number:  
AC02-07CH11358
Resource Type:
Accepted Manuscript
Journal Name:
Physical Review. B, Condensed Matter and Materials Physics
Additional Journal Information:
Journal Volume: 90; Journal Issue: 18; Journal ID: ISSN 1098-0121
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING

Citation Formats

Kogan, V. G., and Mints, R. G.. Effect of current injection into thin-film Josephson junctions. United States: N. p., 2014. Web. doi:10.1103/PhysRevB.90.184504.
Kogan, V. G., & Mints, R. G.. Effect of current injection into thin-film Josephson junctions. United States. https://doi.org/10.1103/PhysRevB.90.184504
Kogan, V. G., and Mints, R. G.. Tue . "Effect of current injection into thin-film Josephson junctions". United States. https://doi.org/10.1103/PhysRevB.90.184504. https://www.osti.gov/servlets/purl/1226910.
@article{osti_1226910,
title = {Effect of current injection into thin-film Josephson junctions},
author = {Kogan, V. G. and Mints, R. G.},
abstractNote = {New thin-film Josephson junctions have recently been tested in which the current injected into one of the junction banks governs Josephson phenomena. One thus can continuously manage the phase distribution at the junction by changing the injected current. Our method of calculating the distribution of injected currents is also proposed for a half-infinite thin-film strip with source-sink points at arbitrary positions at the film edges. The strip width W is assumed small relative to Λ=2λ2/d;λ is the bulk London penetration depth of the film material and d is the film thickness.},
doi = {10.1103/PhysRevB.90.184504},
journal = {Physical Review. B, Condensed Matter and Materials Physics},
number = 18,
volume = 90,
place = {United States},
year = {Tue Nov 11 00:00:00 EST 2014},
month = {Tue Nov 11 00:00:00 EST 2014}
}

Journal Article:

Citation Metrics:
Cited by: 3 works
Citation information provided by
Web of Science

Save / Share: