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Title: Profiling the local carrier concentration across a semiconductor quantum dot

Authors:
 [1] ;  [1] ;  [2] ;  [3]
  1. Department of Physics, University of Michigan, Ann Arbor, Michigan 48109, USA
  2. Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109, USA
  3. Department of Physics, University of Michigan, Ann Arbor, Michigan 48109, USA, Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109, USA
Publication Date:
OSTI Identifier:
1226741
Grant/Contract Number:
SC0000957; FG02-06ER46339; PI0000012
Type:
Publisher's Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 106; Journal Issue: 19; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English