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Title: High throughput on-chip analysis of high-energy charged particle tracks using lensfree imaging

Authors:
 [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [2]
  1. Electrical Engineering Department, University of California, Los Angeles, California 90095, USA
  2. Electrical Engineering Department, University of California, Los Angeles, California 90095, USA, Bioengineering Department, University of California, Los Angeles, California 90095, USA, California NanoSystems Institute (CNSI), University of California, Los Angeles, California 90095, USA
Publication Date:
OSTI Identifier:
1226738
Type:
Publisher's Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 106; Journal Issue: 15; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English