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Title: Nanorheology by atomic force microscopy

Authors:
 [1];  [1];  [1];  [1]
+ Show Author Affiliations
  1. School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1226623
Grant/Contract Number:  
FG02-06ER46293
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Name: Review of Scientific Instruments Journal Volume: 85 Journal Issue: 12; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Li, Tai-De, Chiu, Hsiang-Chih, Ortiz-Young, Deborah, and Riedo, Elisa. Nanorheology by atomic force microscopy. United States: N. p., 2014. Web. doi:10.1063/1.4903353.
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Li, Tai-De, Chiu, Hsiang-Chih, Ortiz-Young, Deborah, & Riedo, Elisa. Nanorheology by atomic force microscopy. United States. https://doi.org/10.1063/1.4903353
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Li, Tai-De, Chiu, Hsiang-Chih, Ortiz-Young, Deborah, and Riedo, Elisa. Fri . "Nanorheology by atomic force microscopy". United States. https://doi.org/10.1063/1.4903353.
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@article{osti_1226623,
title = {Nanorheology by atomic force microscopy},
author = {Li, Tai-De and Chiu, Hsiang-Chih and Ortiz-Young, Deborah and Riedo, Elisa},
abstractNote = {},
doi = {10.1063/1.4903353},
journal = {Review of Scientific Instruments},
number = 12,
volume = 85,
place = {United States},
year = {Fri Dec 19 00:00:00 EST 2014},
month = {Fri Dec 19 00:00:00 EST 2014}
}
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Journal Article:
Free Publicly Available Full Text
Accepted Manuscript (Publisher)
Publisher's Version of Record
https://doi.org/10.1063/1.4903353
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