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Title: Suppression of thermoelectric Thomson effect in silicon microwires under large electrical bias and implications for phase-change memory devices

Authors:
 [1] ;  [2] ;  [2]
  1. Department of Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269-4157, USA, National Nanotechnology Research Center, Bilkent University, Ankara 06800, Turkey
  2. Department of Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269-4157, USA
Publication Date:
OSTI Identifier:
1226620
Grant/Contract Number:
SC0005038
Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 116; Journal Issue: 23; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English