Dual-sensor technique for characterization of carrier lifetime decay transients in semiconductors
- Authors:
-
[2];
- National Renewable Energy Laboratory, Golden, Colorado 80401, USA, Lakewood Semiconductor LLC, Lakewood, Colorado 80232, USA
- National Renewable Energy Laboratory, Golden, Colorado 80401, USA
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1226587
- Grant/Contract Number:
- AC36-08-GO28308
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Journal of Applied Physics
- Additional Journal Information:
- Journal Name: Journal of Applied Physics Journal Volume: 116 Journal Issue: 21; Journal ID: ISSN 0021-8979
- Publisher:
- American Institute of Physics
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Ahrenkiel, R. K., Johnston, S. W., Kuciauskas, D., and Tynan, Jerry. Dual-sensor technique for characterization of carrier lifetime decay transients in semiconductors. United States: N. p., 2014.
Web. doi:10.1063/1.4903213.
Ahrenkiel, R. K., Johnston, S. W., Kuciauskas, D., & Tynan, Jerry. Dual-sensor technique for characterization of carrier lifetime decay transients in semiconductors. United States. https://doi.org/10.1063/1.4903213
Ahrenkiel, R. K., Johnston, S. W., Kuciauskas, D., and Tynan, Jerry. Fri .
"Dual-sensor technique for characterization of carrier lifetime decay transients in semiconductors". United States. https://doi.org/10.1063/1.4903213.
@article{osti_1226587,
title = {Dual-sensor technique for characterization of carrier lifetime decay transients in semiconductors},
author = {Ahrenkiel, R. K. and Johnston, S. W. and Kuciauskas, D. and Tynan, Jerry},
abstractNote = {},
doi = {10.1063/1.4903213},
journal = {Journal of Applied Physics},
number = 21,
volume = 116,
place = {United States},
year = {Fri Dec 05 00:00:00 EST 2014},
month = {Fri Dec 05 00:00:00 EST 2014}
}
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1063/1.4903213
https://doi.org/10.1063/1.4903213
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Cited by: 4 works
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Works referenced in this record:
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