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Title: Single-shot Zeff dense plasma diagnostic through simultaneous refraction and attenuation measurements with a Talbot–Lau x-ray moiré deflectometer

The Talbot–Lau x-ray moiré deflectometer is a powerful plasma diagnostic capable of delivering simultaneous refraction and attenuation information through the accurate detection of x-ray phase shift and intensity. The diagnostic can provide the index of refraction n = 1 - δ + iβ of an object (dense plasma, for example) placed in the x-ray beam by independently measuring both δ and β, which are directly related to the electron density ne and the attenuation coefficient μ, respectively. Since δ and β depend on the effective atomic number Zeff, a map can be obtained from the ratio between phase and absorption images acquired in a single shot. The Talbot–Lau x-ray moiré deflectometer and its corresponding data acquisition and processing are briefly described to illustrate how the above is achieved; Zeff values of test objects within the 4–12 range were obtained experimentally through simultaneous refraction and attenuation measurements. We show that Zeff mapping of objects does not require previous knowledge of sample length or shape. The determination of Zeff from refraction and attenuation measurements with Moiré deflectometry could be of high interest to various domains of HED research, such as shocked materials and ICF experiments, as well as material science and NDT.
Authors:
 [1] ;  [1] ;  [1]
  1. John Hopkins Univ., Baltimore, MD (United States)
Publication Date:
OSTI Identifier:
1223269
Grant/Contract Number:
NA0001835
Type:
Accepted Manuscript
Journal Name:
Applied Optics
Additional Journal Information:
Journal Volume: 54; Journal Issue: 10; Journal ID: ISSN 0003-6935
Publisher:
Optical Society of America (OSA)
Research Org:
Johns Hopkins Univ., Baltimore, MD (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English
Subject:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY Moiré techniques; X-ray imaging; Phase shift