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This content will become publicly available on October 8, 2016

Title: Direct observation of electrical properties of grain boundaries in sputter-deposited CdTe using scan-probe microwave reflectivity based capacitance measurements

Authors:
 [1] ;  [2] ;  [3] ;  [2] ;  [1]
  1. Department of Materials Science and Engineering, University of Illinois, Urbana, Illinois 61801, USA
  2. Department of Physics and Astronomy, University of Toledo, Toledo, Ohio 43606, USA
  3. Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana, Illinois 61801, USA
Publication Date:
OSTI Identifier:
1223156
Grant/Contract Number:
EE0005405
Type:
Publisher's Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 107; Journal Issue: 14; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English