Evaluation of partial coherence correction in X-ray ptychography
Abstract
Coherent X-ray Diffraction Imaging (CDI) and X-ray ptychography both heavily rely on the high degree of spatial coherence of the X-ray illumination for sufficient experimental data quality for reconstruction convergence. Nevertheless, the majority of the available synchrotron undulator sources have a limited degree of partial coherence, leading to reduced data quality and a lower speckle contrast in the coherent diffraction patterns. It is still an open question whether experimentalists should compromise the coherence properties of an X-ray source in exchange for a higher flux density at a sample, especially when some materials of scientific interest are relatively weak scatterers. A previous study has suggested that in CDI, the best strategy for the study of strong phase objects is to maintain a high degree of coherence of the illuminating X-rays because of the broadening of solution space resulting from the strong phase structures. In this article, we demonstrate the first systematic analysis of the effectiveness of partial coherence correction in ptychography as a function of the coherence properties, degree of complexity of illumination (degree of phase diversity of the probe) and sample phase complexity. We have also performed analysis of how well ptychographic algorithms refine X-ray probe and complex coherence functionsmore »
- Authors:
-
- Univ. College London, London (United Kingdom); Research Complex at Hartwell, Oxford (United Kingdom)
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of Oregon, Eugene, OR (United States)
- SLAC National Accelerator Lab., Menlo Park, CA (United States); DESY, Hamburg (Germany)
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Publication Date:
- Research Org.:
- Argonne National Lab. (ANL), Argonne, IL (United States); SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1215676
- Alternate Identifier(s):
- OSTI ID: 1221598
- Grant/Contract Number:
- AC02-06CH11357; FG02-11ER46831; AC02-05CH11231; AC02-05CH11231, AC03-76SF00515
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Optics Express
- Additional Journal Information:
- Journal Volume: 23; Journal Issue: 5; Journal ID: ISSN 1094-4087
- Publisher:
- Optical Society of America (OSA)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; phase retrieval; image reconstruction techniques; X-ray imaging
Citation Formats
Burdet, Nicolas, Shi, Xiaowen, Parks, Daniel, Clark, Jesse N., Huang, Xiaojing, Kevan, Stephen D., and Robinson, Ian K. Evaluation of partial coherence correction in X-ray ptychography. United States: N. p., 2015.
Web. doi:10.1364/OE.23.005452.
Burdet, Nicolas, Shi, Xiaowen, Parks, Daniel, Clark, Jesse N., Huang, Xiaojing, Kevan, Stephen D., & Robinson, Ian K. Evaluation of partial coherence correction in X-ray ptychography. United States. https://doi.org/10.1364/OE.23.005452
Burdet, Nicolas, Shi, Xiaowen, Parks, Daniel, Clark, Jesse N., Huang, Xiaojing, Kevan, Stephen D., and Robinson, Ian K. Mon .
"Evaluation of partial coherence correction in X-ray ptychography". United States. https://doi.org/10.1364/OE.23.005452. https://www.osti.gov/servlets/purl/1215676.
@article{osti_1215676,
title = {Evaluation of partial coherence correction in X-ray ptychography},
author = {Burdet, Nicolas and Shi, Xiaowen and Parks, Daniel and Clark, Jesse N. and Huang, Xiaojing and Kevan, Stephen D. and Robinson, Ian K.},
abstractNote = {Coherent X-ray Diffraction Imaging (CDI) and X-ray ptychography both heavily rely on the high degree of spatial coherence of the X-ray illumination for sufficient experimental data quality for reconstruction convergence. Nevertheless, the majority of the available synchrotron undulator sources have a limited degree of partial coherence, leading to reduced data quality and a lower speckle contrast in the coherent diffraction patterns. It is still an open question whether experimentalists should compromise the coherence properties of an X-ray source in exchange for a higher flux density at a sample, especially when some materials of scientific interest are relatively weak scatterers. A previous study has suggested that in CDI, the best strategy for the study of strong phase objects is to maintain a high degree of coherence of the illuminating X-rays because of the broadening of solution space resulting from the strong phase structures. In this article, we demonstrate the first systematic analysis of the effectiveness of partial coherence correction in ptychography as a function of the coherence properties, degree of complexity of illumination (degree of phase diversity of the probe) and sample phase complexity. We have also performed analysis of how well ptychographic algorithms refine X-ray probe and complex coherence functions when those variables are unknown at the start of reconstructions, for noise-free simulated data, in the case of both real-valued and highly-complex objects.},
doi = {10.1364/OE.23.005452},
journal = {Optics Express},
number = 5,
volume = 23,
place = {United States},
year = {Mon Feb 23 00:00:00 EST 2015},
month = {Mon Feb 23 00:00:00 EST 2015}
}
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Works referenced in this record:
A phase retrieval algorithm for shifting illumination
journal, November 2004
- Rodenburg, J. M.; Faulkner, H. M. L.
- Applied Physics Letters, Vol. 85, Issue 20
Probe retrieval in ptychographic coherent diffractive imaging
journal, March 2009
- Thibault, Pierre; Dierolf, Martin; Bunk, Oliver
- Ultramicroscopy, Vol. 109, Issue 4
Phase retrieval with transverse translation diversity: a nonlinear optimization approach
journal, January 2008
- Guizar-Sicairos, Manuel; Fienup, James R.
- Optics Express, Vol. 16, Issue 10
Diffractive imaging using a polychromatic high-harmonic generation soft-x-ray source
journal, July 2009
- Dilanian, Ruben A.; Chen, Bo; Williams, Garth J.
- Journal of Applied Physics, Vol. 106, Issue 2
Lensless imaging using broadband X-ray sources
journal, June 2011
- Abbey, Brian; Whitehead, Lachlan W.; Quiney, Harry M.
- Nature Photonics, Vol. 5, Issue 7
Multiple wavelength diffractive imaging
journal, February 2009
- Chen, Bo; Dilanian, Ruben A.; Teichmann, Sven
- Physical Review A, Vol. 79, Issue 2
Diffractive Imaging Using Partially Coherent X Rays
journal, December 2009
- Whitehead, L. W.; Williams, G. J.; Quiney, H. M.
- Physical Review Letters, Vol. 103, Issue 24
High-resolution three-dimensional partially coherent diffraction imaging
journal, January 2012
- Clark, J. N.; Huang, X.; Harder, R.
- Nature Communications, Vol. 3, Issue 1
Reconstructing state mixtures from diffraction measurements
journal, February 2013
- Thibault, Pierre; Menzel, Andreas
- Nature, Vol. 494, Issue 7435
Information multiplexing in ptychography
journal, March 2014
- Batey, Darren J.; Claus, Daniel; Rodenburg, John M.
- Ultramicroscopy, Vol. 138
Dynamic Imaging Using Ptychography
journal, March 2014
- Clark, Jesse N.; Huang, Xiaojing; Harder, Ross J.
- Physical Review Letters, Vol. 112, Issue 11
Quantitative phase retrieval of a complex-valued object using variable function orders in the fractional Fourier domain
journal, January 2010
- Chen, Wen; Chen, Xudong
- Optics Express, Vol. 18, Issue 13
Quantitative phase retrieval of complex-valued specimens based on noninterferometric imaging
journal, January 2011
- Chen, Wen; Chen, Xudong
- Applied Optics, Vol. 50, Issue 14
Phase retrieval from the magnitude of the Fourier transforms of nonperiodic objects
journal, January 1998
- Miao, J.; Sayre, D.; Chapman, H. N.
- Journal of the Optical Society of America A, Vol. 15, Issue 6
Partially coherent x-ray diffractive imaging of complex objects
journal, June 2014
- Parks, D. H.; Shi, X.; Kevan, S. D.
- Physical Review A, Vol. 89, Issue 6
Coherent methods in the X-ray sciences
journal, January 2010
- Nugent, Keith A.
- Advances in Physics, Vol. 59, Issue 1
Direct Measurement of Transverse Coherence Length of Hard X Rays from Interference Fringes
journal, September 2000
- Kohn, V.; Snigireva, I.; Snigirev, A.
- Physical Review Letters, Vol. 85, Issue 13
Hard X-ray nanofocusing at low-emittance synchrotron radiation sources
journal, August 2014
- Schroer, Christian G.; Falkenberg, Gerald
- Journal of Synchrotron Radiation, Vol. 21, Issue 5
Investigating non-Gaussian scattering processes by using nth -order intensity correlation functions
journal, January 1999
- Lemieux, P. -A.; Durian, D. J.
- Journal of the Optical Society of America A, Vol. 16, Issue 7
Phase retrieval algorithms: a personal tour [Invited]
journal, December 2012
- Fienup, James R.
- Applied Optics, Vol. 52, Issue 1
Observations of artefacts in the x-ray ptychography method
journal, January 2014
- Burdet, Nicolas; Morrison, Graeme R.; Huang, Xiaojing
- Optics Express, Vol. 22, Issue 9
High-resolution ab initio three-dimensional x-ray diffraction microscopy
journal, January 2006
- Chapman, Henry N.; Barty, Anton; Marchesini, Stefano
- Journal of the Optical Society of America A, Vol. 23, Issue 5
Phase retrieval with random phase illumination
journal, January 2012
- Fannjiang, Albert; Liao, Wenjing
- Journal of the Optical Society of America A, Vol. 29, Issue 9
Soft X-ray spectromicroscopy using ptychography with randomly phased illumination
journal, April 2013
- Maiden, A. M.; Morrison, G. R.; Kaulich, B.
- Nature Communications, Vol. 4, Issue 1
Analysis of illumination coherence properties in small-source systems such as synchrotrons
journal, January 2003
- Chang, Chang; Naulleau, Patrick; Attwood, David
- Applied Optics, Vol. 42, Issue 14
Transverse-Coherence Properties of the Free-Electron-Laser FLASH at DESY
journal, December 2008
- Singer, A.; Vartanyants, I. A.; Kuhlmann, M.
- Physical Review Letters, Vol. 101, Issue 25
Shearing Interferometer for Quantifying the Coherence of Hard X-Ray Beams
journal, April 2005
- Pfeiffer, F.; Bunk, O.; Schulze-Briese, C.
- Physical Review Letters, Vol. 94, Issue 16
Sampling in x-ray ptychography
journal, May 2013
- Edo, T. B.; Batey, D. J.; Maiden, A. M.
- Physical Review A, Vol. 87, Issue 5
Works referencing / citing this record:
Transverse Coherence Limited Coherent Diffraction Imaging using a Molybdenum Soft X-ray Laser Pumped at Moderate Pump Energies
journal, July 2017
- Zürch, M.; Jung, R.; Späth, C.
- Scientific Reports, Vol. 7, Issue 1
X-ray ptychography on low-dimensional hard-condensed matter materials
journal, March 2019
- Shi, Xiaowen; Burdet, Nicolas; Chen, Bo
- Applied Physics Reviews, Vol. 6, Issue 1
Non-iterative method for phase retrieval and coherence characterization by focus variation using a fixed star-shaped mask
journal, January 2018
- Konijnenberg, A. P.; Lu, Xingyuan; Liu, Leixin
- Optics Express, Vol. 26, Issue 7
Quantitative phase and amplitude imaging with an efficient support constraint
journal, January 2019
- Hu, Jing; Shen, Yibing; Xie, Xiwei
- Optics Express, Vol. 27, Issue 13
Ptychography with multiple wavelength illumination
journal, January 2019
- Wei, Xukang; Urbach, Paul
- Optics Express, Vol. 27, Issue 25