Tellurium n-type doping of highly mismatched amorphous GaN1-xAsx alloys in plasma-assisted molecular beam epitaxy
Abstract
In this paper we report our study on n-type Te doping of amorphous GaN1-xAsx layers grown by plasma-assisted molecular beam epitaxy. We have used a low temperature PbTe source as a source of tellurium. Reproducible and uniform tellurium incorporation in amorphous GaN1-xAsx layers has been successfully achieved with a maximum Te concentration of 9×10²⁰ cm⁻³. Tellurium incorporation resulted in n-doping of GaN1-xAsx layers with Hall carrier concentrations up to 3×10¹⁹ cm⁻³ and mobilities of ~1 cm²/V s. The optimal growth temperature window for efficient Te doping of the amorphous GaN1-xAsx layers has been determined.
- Authors:
-
- Univ. of Nottingham (United Kingdom)
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of California, Berkeley, CA (United States)
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- US Army Research Lab., Adelphi, MD (United States)
- Univ. of Strathclyde, Glasgow (United Kingdom)
- Publication Date:
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1209763
- Grant/Contract Number:
- AC02-05CH11231
- Resource Type:
- Published Article
- Journal Name:
- Journal of Crystal Growth
- Additional Journal Information:
- Journal Name: Journal of Crystal Growth Journal Volume: 404 Journal Issue: C; Journal ID: ISSN 0022-0248
- Publisher:
- Elsevier
- Country of Publication:
- Netherlands
- Language:
- English
Citation Formats
Novikov, S. V., Ting, M., Yu, K. M., Sarney, W. L., Martin, R. W., Svensson, S. P., Walukiewicz, W., and Foxon, C. T. Tellurium n-type doping of highly mismatched amorphous GaN1-xAsx alloys in plasma-assisted molecular beam epitaxy. Netherlands: N. p., 2014.
Web. doi:10.1016/j.jcrysgro.2014.06.042.
Novikov, S. V., Ting, M., Yu, K. M., Sarney, W. L., Martin, R. W., Svensson, S. P., Walukiewicz, W., & Foxon, C. T. Tellurium n-type doping of highly mismatched amorphous GaN1-xAsx alloys in plasma-assisted molecular beam epitaxy. Netherlands. https://doi.org/10.1016/j.jcrysgro.2014.06.042
Novikov, S. V., Ting, M., Yu, K. M., Sarney, W. L., Martin, R. W., Svensson, S. P., Walukiewicz, W., and Foxon, C. T. Wed .
"Tellurium n-type doping of highly mismatched amorphous GaN1-xAsx alloys in plasma-assisted molecular beam epitaxy". Netherlands. https://doi.org/10.1016/j.jcrysgro.2014.06.042.
@article{osti_1209763,
title = {Tellurium n-type doping of highly mismatched amorphous GaN1-xAsx alloys in plasma-assisted molecular beam epitaxy},
author = {Novikov, S. V. and Ting, M. and Yu, K. M. and Sarney, W. L. and Martin, R. W. and Svensson, S. P. and Walukiewicz, W. and Foxon, C. T.},
abstractNote = {In this paper we report our study on n-type Te doping of amorphous GaN1-xAsx layers grown by plasma-assisted molecular beam epitaxy. We have used a low temperature PbTe source as a source of tellurium. Reproducible and uniform tellurium incorporation in amorphous GaN1-xAsx layers has been successfully achieved with a maximum Te concentration of 9×10²⁰ cm⁻³. Tellurium incorporation resulted in n-doping of GaN1-xAsx layers with Hall carrier concentrations up to 3×10¹⁹ cm⁻³ and mobilities of ~1 cm²/V s. The optimal growth temperature window for efficient Te doping of the amorphous GaN1-xAsx layers has been determined.},
doi = {10.1016/j.jcrysgro.2014.06.042},
journal = {Journal of Crystal Growth},
number = C,
volume = 404,
place = {Netherlands},
year = {Wed Oct 01 00:00:00 EDT 2014},
month = {Wed Oct 01 00:00:00 EDT 2014}
}
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https://doi.org/10.1016/j.jcrysgro.2014.06.042
https://doi.org/10.1016/j.jcrysgro.2014.06.042
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Cited by: 3 works
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