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Title: Operational properties of fluctuation X-ray scattering data

X-ray scattering images collected on timescales shorter than rotation diffusion times using a (partially) coherent beam result in a significant increase in information content in the scattered data. These measurements, named fluctuation X-ray scattering (FXS), are typically performed on an X-ray free-electron laser (XFEL) and can provide fundamental insights into the structure of biological molecules, engineered nanoparticles or energy-related mesoscopic materials beyond what can be obtained with standard X-ray scattering techniques. In order to understand, use and validate experimental FXS data, the availability of basic data characteristics and operational properties is essential, but has been absent up to this point. In this communication, an intuitive view of the nature of FXS data and their properties is provided, the effect of FXS data on the derived structural models is highlighted, and generalizations of the Guinier and Porod laws that can ultimately be used to plan experiments and assess the quality of experimental data are presented.
Authors:
 [1] ;  [2] ;  [3]
  1. Lawrence Berkeley National Lab., CA (United States); Univ. of California, Berkeley, CA (United States). Dept. of Plant and Microbial Biology
  2. Lawrence Berkeley National Lab., CA (United States); Univ. of California, Berkeley, CA (United States). Dept. of Plant and Microbial Biology; Michican State Univ., East Lansing, MI (United States). DOE Plant Research Lab.
  3. Lawrence Berkeley National Lab., CA (United States)
Publication Date:
OSTI Identifier:
1209529
Grant/Contract Number:
AC02-05CH11231
Type:
Accepted Manuscript
Journal Name:
IUCrJ
Additional Journal Information:
Journal Volume: 2; Journal Issue: 3; Journal ID: ISSN 2052-2525
Publisher:
International Union of Crystallography
Research Org:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Org:
USDOE; NSF
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY fluctuation X-ray scattering; XFELS; biological molecules; nanoparticles; mesoscopic materials