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Title: Evaluation of the SEI using a multilayer spectroscopic ellipsometry model

A multilayer spectroscopic ellipsometry (SE) model has been developed to characterize SEI formation. The model, which consists of two Cauchy layers, is constructed with an inner layer meant to model primarily inorganic compounds adjacent to an electrode and an outer layer which mirrors polymeric, organic constituents on the exterior of the SEI. Comparison of 1:1 EC:EMC and 1:4 EC:EMC with 1.0 M LiPF₆ shows distinct differences in the two modeled layers. The data suggest that the thickness of both layers change over a wide potential range. These changes have been linked with other reports on the growth of the SEI.
Authors:
 [1]
  1. Idaho National Lab. (INL), Idaho Falls, ID (United States)
Publication Date:
OSTI Identifier:
1193712
Report Number(s):
INL/JOU--14-31952
Journal ID: ISSN 2162-8726
Grant/Contract Number:
AC07-05ID14517
Type:
Accepted Manuscript
Journal Name:
ECS Electrochemistry Letters
Additional Journal Information:
Journal Volume: 3; Journal Issue: 11; Journal ID: ISSN 2162-8726
Publisher:
Electrochemical Society
Research Org:
Idaho National Lab. (INL), Idaho Falls, ID (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE