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Title: A simple growth method for Nb2O5 films and their optical properties

Abstract

A simple method for the synthesis of Nb₂O₅ films of thicknesses ranging from tens to several hundreds of nanometers on amorphous silicon dioxide or quartz substrates is presented. Nb₂O₅ films were formed by annealing the sputter deposited Nb films under an Ar flow and without oxygen plasma in a quartz tube within a furnace at 850 °C. The structural, compositional, optical, and vibrational properties were characterized by grazing incidence X-ray diffraction, transmission electron microscopy, X-ray photoelectron spectroscopy, ultraviolet visible spectroscopy, and Raman scattering. Each of the Nb₂O₅ films is polycrystalline with an orthorhombic crystal structure. We observed vibrational modes including longitudinal optical, transverse optical, and triply degenerate modes, and measured the indirect optical band gap to be ~3.65 eV. The transmittance spectrum of the ~20 nm thick Nb₂O₅ film shows over 90% transmittance below the band gap energy in the visible wavelength range and decreases to less than 20% in the ultraviolet regime. As a result, the optical properties of the films in the UV-vis range show potential applications as UV detectors.

Authors:
 [1];  [1];  [1];  [1];  [2];  [2];  [1];  [1]
  1. Rensselaer Polytechnic Inst., Troy, NY (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States)
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1193232
Report Number(s):
BNL-108133-2015-JA
Journal ID: ISSN 2046-2069; RSCACL
Grant/Contract Number:  
SC00112704
Resource Type:
Accepted Manuscript
Journal Name:
RSC Advances
Additional Journal Information:
Journal Volume: 5; Journal Issue: 45; Journal ID: ISSN 2046-2069
Publisher:
Royal Society of Chemistry
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Dash, J. K., Chen, L., Topka, Michael R., Dinolfo, Peter H., Zhang, L. H., Kisslinger, K., Lu, T. -M., and Wang, G. -C.. A simple growth method for Nb2O5 films and their optical properties. United States: N. p., 2015. Web. doi:10.1039/C5RA05074J.
Dash, J. K., Chen, L., Topka, Michael R., Dinolfo, Peter H., Zhang, L. H., Kisslinger, K., Lu, T. -M., & Wang, G. -C.. A simple growth method for Nb2O5 films and their optical properties. United States. https://doi.org/10.1039/C5RA05074J
Dash, J. K., Chen, L., Topka, Michael R., Dinolfo, Peter H., Zhang, L. H., Kisslinger, K., Lu, T. -M., and Wang, G. -C.. Mon . "A simple growth method for Nb2O5 films and their optical properties". United States. https://doi.org/10.1039/C5RA05074J. https://www.osti.gov/servlets/purl/1193232.
@article{osti_1193232,
title = {A simple growth method for Nb2O5 films and their optical properties},
author = {Dash, J. K. and Chen, L. and Topka, Michael R. and Dinolfo, Peter H. and Zhang, L. H. and Kisslinger, K. and Lu, T. -M. and Wang, G. -C.},
abstractNote = {A simple method for the synthesis of Nb₂O₅ films of thicknesses ranging from tens to several hundreds of nanometers on amorphous silicon dioxide or quartz substrates is presented. Nb₂O₅ films were formed by annealing the sputter deposited Nb films under an Ar flow and without oxygen plasma in a quartz tube within a furnace at 850 °C. The structural, compositional, optical, and vibrational properties were characterized by grazing incidence X-ray diffraction, transmission electron microscopy, X-ray photoelectron spectroscopy, ultraviolet visible spectroscopy, and Raman scattering. Each of the Nb₂O₅ films is polycrystalline with an orthorhombic crystal structure. We observed vibrational modes including longitudinal optical, transverse optical, and triply degenerate modes, and measured the indirect optical band gap to be ~3.65 eV. The transmittance spectrum of the ~20 nm thick Nb₂O₅ film shows over 90% transmittance below the band gap energy in the visible wavelength range and decreases to less than 20% in the ultraviolet regime. As a result, the optical properties of the films in the UV-vis range show potential applications as UV detectors.},
doi = {10.1039/C5RA05074J},
journal = {RSC Advances},
number = 45,
volume = 5,
place = {United States},
year = {Mon Apr 13 00:00:00 EDT 2015},
month = {Mon Apr 13 00:00:00 EDT 2015}
}

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Works referencing / citing this record:

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