A simple growth method for Nb2O5 films and their optical properties
Abstract
A simple method for the synthesis of Nb₂O₅ films of thicknesses ranging from tens to several hundreds of nanometers on amorphous silicon dioxide or quartz substrates is presented. Nb₂O₅ films were formed by annealing the sputter deposited Nb films under an Ar flow and without oxygen plasma in a quartz tube within a furnace at 850 °C. The structural, compositional, optical, and vibrational properties were characterized by grazing incidence X-ray diffraction, transmission electron microscopy, X-ray photoelectron spectroscopy, ultraviolet visible spectroscopy, and Raman scattering. Each of the Nb₂O₅ films is polycrystalline with an orthorhombic crystal structure. We observed vibrational modes including longitudinal optical, transverse optical, and triply degenerate modes, and measured the indirect optical band gap to be ~3.65 eV. The transmittance spectrum of the ~20 nm thick Nb₂O₅ film shows over 90% transmittance below the band gap energy in the visible wavelength range and decreases to less than 20% in the ultraviolet regime. As a result, the optical properties of the films in the UV-vis range show potential applications as UV detectors.
- Authors:
-
- Rensselaer Polytechnic Inst., Troy, NY (United States)
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Publication Date:
- Research Org.:
- Brookhaven National Laboratory (BNL), Upton, NY (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1193232
- Report Number(s):
- BNL-108133-2015-JA
Journal ID: ISSN 2046-2069; RSCACL
- Grant/Contract Number:
- SC00112704
- Resource Type:
- Accepted Manuscript
- Journal Name:
- RSC Advances
- Additional Journal Information:
- Journal Volume: 5; Journal Issue: 45; Journal ID: ISSN 2046-2069
- Publisher:
- Royal Society of Chemistry
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Dash, J. K., Chen, L., Topka, Michael R., Dinolfo, Peter H., Zhang, L. H., Kisslinger, K., Lu, T. -M., and Wang, G. -C.. A simple growth method for Nb2O5 films and their optical properties. United States: N. p., 2015.
Web. doi:10.1039/C5RA05074J.
Dash, J. K., Chen, L., Topka, Michael R., Dinolfo, Peter H., Zhang, L. H., Kisslinger, K., Lu, T. -M., & Wang, G. -C.. A simple growth method for Nb2O5 films and their optical properties. United States. https://doi.org/10.1039/C5RA05074J
Dash, J. K., Chen, L., Topka, Michael R., Dinolfo, Peter H., Zhang, L. H., Kisslinger, K., Lu, T. -M., and Wang, G. -C.. Mon .
"A simple growth method for Nb2O5 films and their optical properties". United States. https://doi.org/10.1039/C5RA05074J. https://www.osti.gov/servlets/purl/1193232.
@article{osti_1193232,
title = {A simple growth method for Nb2O5 films and their optical properties},
author = {Dash, J. K. and Chen, L. and Topka, Michael R. and Dinolfo, Peter H. and Zhang, L. H. and Kisslinger, K. and Lu, T. -M. and Wang, G. -C.},
abstractNote = {A simple method for the synthesis of Nb₂O₅ films of thicknesses ranging from tens to several hundreds of nanometers on amorphous silicon dioxide or quartz substrates is presented. Nb₂O₅ films were formed by annealing the sputter deposited Nb films under an Ar flow and without oxygen plasma in a quartz tube within a furnace at 850 °C. The structural, compositional, optical, and vibrational properties were characterized by grazing incidence X-ray diffraction, transmission electron microscopy, X-ray photoelectron spectroscopy, ultraviolet visible spectroscopy, and Raman scattering. Each of the Nb₂O₅ films is polycrystalline with an orthorhombic crystal structure. We observed vibrational modes including longitudinal optical, transverse optical, and triply degenerate modes, and measured the indirect optical band gap to be ~3.65 eV. The transmittance spectrum of the ~20 nm thick Nb₂O₅ film shows over 90% transmittance below the band gap energy in the visible wavelength range and decreases to less than 20% in the ultraviolet regime. As a result, the optical properties of the films in the UV-vis range show potential applications as UV detectors.},
doi = {10.1039/C5RA05074J},
journal = {RSC Advances},
number = 45,
volume = 5,
place = {United States},
year = {Mon Apr 13 00:00:00 EDT 2015},
month = {Mon Apr 13 00:00:00 EDT 2015}
}
Web of Science
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