Thermal flux limited electron Kapitza conductance in copper-niobium multilayers
Abstract
We study the interplay between the contributions of electron thermal flux and interface scattering to the Kapitza conductance across metal-metal interfaces through measurements of thermal conductivity of copper-niobium multilayers. Thermal conductivities of copper-niobium multilayer films of period thicknesses ranging from 5.4 to 96.2 nm and sample thicknesses ranging from 962 to 2677 nm are measured by time-domain thermoreflectance over a range of temperatures from 78 to 500 K. The Kapitza conductances between the Cu and Nb interfaces in multilayer films are determined from the thermal conductivities using a series resistor model and are in good agreement with the electron diffuse mismatch model. Our results for the thermal boundary conductance between Cu and Nb are compared to literature values for the thermal boundary conductance across Al-Cu and Pd-Ir interfaces, and demonstrate that the interface conductance in metallic systems is dictated by the temperature derivative of the electron energy flux in the metallic layers, rather than electron mean free path or scattering processes at the interface.
- Authors:
-
- Univ. of Virginia, Charlottesville, VA (United States)
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Univ. of California, Berkeley, CA (United States)
- Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
- Univ. of Michigan, Ann Arbor, MI (United States)
- Publication Date:
- Research Org.:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1183079
- Alternate Identifier(s):
- OSTI ID: 1420541
- Report Number(s):
- SAND-2014-16696J
Journal ID: ISSN 0003-6951; 534589
- Grant/Contract Number:
- AC04-94AL85000
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Applied Physics Letters
- Additional Journal Information:
- Journal Volume: 106; Journal Issue: 09; Journal ID: ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
Citation Formats
Cheaito, Ramez, Hattar, Khalid Mikhiel, Gaskins, John T., Yadav, Ajay K., Duda, John C., Beechem, III, Thomas Edwin, Ihlefeld, Jon, Piekos, Edward S., Baldwin, Jon K., Misra, Amit, and Hopkins, Patrick E. Thermal flux limited electron Kapitza conductance in copper-niobium multilayers. United States: N. p., 2015.
Web. doi:10.1063/1.4913420.
Cheaito, Ramez, Hattar, Khalid Mikhiel, Gaskins, John T., Yadav, Ajay K., Duda, John C., Beechem, III, Thomas Edwin, Ihlefeld, Jon, Piekos, Edward S., Baldwin, Jon K., Misra, Amit, & Hopkins, Patrick E. Thermal flux limited electron Kapitza conductance in copper-niobium multilayers. United States. https://doi.org/10.1063/1.4913420
Cheaito, Ramez, Hattar, Khalid Mikhiel, Gaskins, John T., Yadav, Ajay K., Duda, John C., Beechem, III, Thomas Edwin, Ihlefeld, Jon, Piekos, Edward S., Baldwin, Jon K., Misra, Amit, and Hopkins, Patrick E. Thu .
"Thermal flux limited electron Kapitza conductance in copper-niobium multilayers". United States. https://doi.org/10.1063/1.4913420. https://www.osti.gov/servlets/purl/1183079.
@article{osti_1183079,
title = {Thermal flux limited electron Kapitza conductance in copper-niobium multilayers},
author = {Cheaito, Ramez and Hattar, Khalid Mikhiel and Gaskins, John T. and Yadav, Ajay K. and Duda, John C. and Beechem, III, Thomas Edwin and Ihlefeld, Jon and Piekos, Edward S. and Baldwin, Jon K. and Misra, Amit and Hopkins, Patrick E.},
abstractNote = {We study the interplay between the contributions of electron thermal flux and interface scattering to the Kapitza conductance across metal-metal interfaces through measurements of thermal conductivity of copper-niobium multilayers. Thermal conductivities of copper-niobium multilayer films of period thicknesses ranging from 5.4 to 96.2 nm and sample thicknesses ranging from 962 to 2677 nm are measured by time-domain thermoreflectance over a range of temperatures from 78 to 500 K. The Kapitza conductances between the Cu and Nb interfaces in multilayer films are determined from the thermal conductivities using a series resistor model and are in good agreement with the electron diffuse mismatch model. Our results for the thermal boundary conductance between Cu and Nb are compared to literature values for the thermal boundary conductance across Al-Cu and Pd-Ir interfaces, and demonstrate that the interface conductance in metallic systems is dictated by the temperature derivative of the electron energy flux in the metallic layers, rather than electron mean free path or scattering processes at the interface.},
doi = {10.1063/1.4913420},
journal = {Applied Physics Letters},
number = 09,
volume = 106,
place = {United States},
year = {Thu Mar 05 00:00:00 EST 2015},
month = {Thu Mar 05 00:00:00 EST 2015}
}
Web of Science
Works referenced in this record:
Nanoscale thermal transport
journal, January 2003
- Cahill, David G.; Ford, Wayne K.; Goodson, Kenneth E.
- Journal of Applied Physics, Vol. 93, Issue 2, p. 793-818
Thermal boundary resistance
journal, July 1989
- Swartz, E. T.; Pohl, R. O.
- Reviews of Modern Physics, Vol. 61, Issue 3, p. 605-668
Thermal Transport across Solid Interfaces with Nanoscale Imperfections: Effects of Roughness, Disorder, Dislocations, and Bonding on Thermal Boundary Conductance
journal, January 2013
- Hopkins, Patrick E.
- ISRN Mechanical Engineering, Vol. 2013
Energy dissipation and transport in nanoscale devices
journal, March 2010
- Pop, Eric
- Nano Research, Vol. 3, Issue 3
Tuning Phonon Transport: From Interfaces to Nanostructures
journal, May 2013
- Norris, Pamela M.; Le, Nam Q.; Baker, Christopher H.
- Journal of Heat Transfer, Vol. 135, Issue 6
Design of radiation resistant metallic multilayers for advanced nuclear systems
journal, June 2014
- Zhernenkov, Mikhail; Gill, Simerjeet; Stanic, Vesna
- Applied Physics Letters, Vol. 104, Issue 24
Design of Radiation Tolerant Nanostructured Metallic Multilayers
journal, August 2012
- Zhang, X.; Fu, E. G.; Li, Nan
- Journal of Engineering Materials and Technology, Vol. 134, Issue 4
Field-dependent thermoelectric power and thermal conductivity in multilayered and granular giant magnetoresistive systems
journal, December 1996
- Shi, Jing; Pettit, Kevin; Kita, E.
- Physical Review B, Vol. 54, Issue 21
Field-dependent thermal and electrical transports in Cu∕CoFe multilayer
journal, March 2006
- Yang, Y.; Zhu, J. -G.; White, R. M.
- Journal of Applied Physics, Vol. 99, Issue 6
Perpendicular-current studies of electron transport across metal/metal interfaces
journal, October 2009
- Pratt, W. P.; Bass, J.
- Applied Surface Science, Vol. 256, Issue 2
Measurements of transport properties of Ag/Al and Ag/Cu multilayered films
journal, September 1993
- Soe, W. -H.; Kaizuka, T.; Yamamoto, R.
- Journal of Magnetism and Magnetic Materials, Vol. 126, Issue 1-3
Experimental Validation of the Interfacial Form of the Wiedemann-Franz Law
journal, June 2012
- Wilson, R. B.; Cahill, David G.
- Physical Review Letters, Vol. 108, Issue 25
Role of electron–phonon coupling in thermal conductance of metal–nonmetal interfaces
journal, June 2004
- Majumdar, Arun; Reddy, Pramod
- Applied Physics Letters, Vol. 84, Issue 23
Electronic Kapitza conductance due to inelastic electron-boundary scattering
journal, October 1998
- Sergeev, A. V.
- Physical Review B, Vol. 58, Issue 16
Spectral analysis of thermal boundary conductance across solid/classical liquid interfaces: A molecular dynamics study
journal, July 2014
- Giri, Ashutosh; Hopkins, Patrick E.
- Applied Physics Letters, Vol. 105, Issue 3
Effects of electron scattering at metal-nonmetal interfaces on electron-phonon equilibration in gold films
journal, January 2009
- Hopkins, Patrick E.; Kassebaum, Jared L.; Norris, Pamela M.
- Journal of Applied Physics, Vol. 105, Issue 2
Thermal conductance of metal-metal interfaces
journal, December 2005
- Gundrum, Bryan C.; Cahill, David G.; Averback, Robert S.
- Physical Review B, Vol. 72, Issue 24
Effects of subconduction band excitations on thermal conductance at metal-metal interfaces
journal, January 2010
- Hopkins, Patrick E.; Beechem, Thomas E.; Duda, John C.
- Applied Physics Letters, Vol. 96, Issue 1
Time-resolved thermal transport in compositionally modulated metal films
journal, January 1988
- Clemens, Bruce M.; Eesley, Gary L.; Paddock, Carolyn A.
- Physical Review B, Vol. 37, Issue 3
Thermal-conductivity measurements of GaAs/AlAs superlattices using a picosecond optical pump-and-probe technique
journal, March 1999
- Capinski, W. S.; Maris, H. J.; Ruf, T.
- Physical Review B, Vol. 59, Issue 12
Thermal conductivity of Si/SiGe and SiGe/SiGe superlattices
journal, March 2002
- Huxtable, Scott T.; Abramson, Alexis R.; Tien, Chang-Lin
- Applied Physics Letters, Vol. 80, Issue 10
Ultra-Low Thermal Conductivity in W/Al2O3 Nanolaminates
journal, February 2004
- Costescu, R. M.
- Science, Vol. 303, Issue 5660
Heat-Transport Mechanisms in Superlattices
journal, February 2009
- Koh, Yee Kan; Cao, Yu; Cahill, David G.
- Advanced Functional Materials, Vol. 19, Issue 4
A thermodynamic analysis of the binary alloy systems Cu-Cr, Cu-Nb and Cu-V
journal, April 1990
- Hämäläinen, M.; Jääskeläinen, K.; Luoma, R.
- Calphad, Vol. 14, Issue 2
Unusual alloying behavior at the equilibrium immiscible Cu–Nb interfaces
journal, September 2004
- Gong, H. R.; Liu, B. X.
- Journal of Applied Physics, Vol. 96, Issue 5
Thermal stability of self-supported nanolayered Cu/Nb films
journal, April 2004
- Misra, A.; Hoagland, R. G.; Kung ‡, H.
- Philosophical Magazine, Vol. 84, Issue 10
Analysis of heat flow in layered structures for time-domain thermoreflectance
journal, December 2004
- Cahill, David G.
- Review of Scientific Instruments, Vol. 75, Issue 12
Pulse accumulation, radial heat conduction, and anisotropic thermal conductivity in pump-probe transient thermoreflectance
journal, November 2008
- Schmidt, Aaron J.; Chen, Xiaoyuan; Chen, Gang
- Review of Scientific Instruments, Vol. 79, Issue 11
Criteria for Cross-Plane Dominated Thermal Transport in Multilayer Thin Film Systems During Modulated Laser Heating
journal, May 2010
- Hopkins, Patrick E.; Serrano, Justin R.; Phinney, Leslie M.
- Journal of Heat Transfer, Vol. 132, Issue 8
Works referencing / citing this record:
A Review of Experimental and Computational Advances in Thermal Boundary Conductance and Nanoscale Thermal Transport across Solid Interfaces
journal, August 2019
- Giri, Ashutosh; Hopkins, Patrick E.
- Advanced Functional Materials
Femtosecond laser generation of microbumps and nanojets on single and bilayer Cu/Ag thin films
journal, January 2019
- Naghilou, Aida; He, Miao; Schubert, Jasmin S.
- Physical Chemistry Chemical Physics, Vol. 21, Issue 22
Thin Ti adhesion layer breaks bottleneck to hot hole relaxation in Au films
journal, May 2019
- Zhou, Xin; Tokina, Marina V.; Tomko, John A.
- The Journal of Chemical Physics, Vol. 150, Issue 18
Spatially resolved thermoreflectance techniques for thermal conductivity measurements from the nanoscale to the mesoscale
journal, October 2019
- Olson, David H.; Braun, Jeffrey L.; Hopkins, Patrick E.
- Journal of Applied Physics, Vol. 126, Issue 15
Titanium contacts to graphene: process-induced variability in electronic and thermal transport
journal, February 2018
- Freedy, Keren M.; Giri, Ashutosh; Foley, Brian M.
- Nanotechnology, Vol. 29, Issue 14
Determining heat-transfer coefficients of solid objects by laser photothermal IR radiometry
journal, July 2017
- Aleksandrov, S. E.; Gavrilov, G. A.; Kapralov, A. A.
- Technical Physics Letters, Vol. 43, Issue 7
Titanium Contacts to Graphene: Process-Induced Variability in Electronic and Thermal Transport
text, January 2017
- Freedy, Keren M.; Giri, Ashutosh; Foley, Brian M.
- arXiv