Effects of strain and buffer layer on interfacial magnetization in films determined by polarized neutron reflectometry
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1181130
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Physical Review B
- Additional Journal Information:
- Journal Volume: 90; Journal Issue: 10; Journal ID: ISSN 1098-0121
- Publisher:
- American Physical Society
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Liu, Yaohua, Lucy, J. M., Glavic, A., Ambaye, H., Lauter, V., Yang, F. Y., and te Velthuis, S. G. E. Effects of strain and buffer layer on interfacial magnetization in Sr 2 CrReO 6 films determined by polarized neutron reflectometry. United States: N. p., 2014.
Web. doi:10.1103/PhysRevB.90.104416.
Liu, Yaohua, Lucy, J. M., Glavic, A., Ambaye, H., Lauter, V., Yang, F. Y., & te Velthuis, S. G. E. Effects of strain and buffer layer on interfacial magnetization in Sr 2 CrReO 6 films determined by polarized neutron reflectometry. United States. https://doi.org/10.1103/PhysRevB.90.104416
Liu, Yaohua, Lucy, J. M., Glavic, A., Ambaye, H., Lauter, V., Yang, F. Y., and te Velthuis, S. G. E. Fri .
"Effects of strain and buffer layer on interfacial magnetization in Sr 2 CrReO 6 films determined by polarized neutron reflectometry". United States. https://doi.org/10.1103/PhysRevB.90.104416.
@article{osti_1181130,
title = {Effects of strain and buffer layer on interfacial magnetization in Sr 2 CrReO 6 films determined by polarized neutron reflectometry},
author = {Liu, Yaohua and Lucy, J. M. and Glavic, A. and Ambaye, H. and Lauter, V. and Yang, F. Y. and te Velthuis, S. G. E.},
abstractNote = {},
doi = {10.1103/PhysRevB.90.104416},
journal = {Physical Review B},
number = 10,
volume = 90,
place = {United States},
year = {Fri Sep 19 00:00:00 EDT 2014},
month = {Fri Sep 19 00:00:00 EDT 2014}
}
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1103/PhysRevB.90.104416
https://doi.org/10.1103/PhysRevB.90.104416
Other availability
Cited by: 5 works
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